XPS and STEM study of the interface formation between Ultra-Thin Ru and Ir OER catalyst layers and perylene red support whiskers

L. L. Atanasoska, D. A. Cullen, A. E. Hester, R. T. Atanasoski

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations

    Abstract

    The interface formation between perylene red (PR) and ruthenium or iridium OER catalysts has been studied systematically by XPS and STEM. The OER catalyst over-layers with thicknesses ranging from ∼0.1 to ∼50 nm were vapor deposited onto PR ex-situ. As seen by STEM, Ru and Ir form into nanoparticles, which agglomerate with increased loading. XPS data show a strong interaction between Ru and PR. Ir also interacts with PR although not to the extent seen for Ru. At low coverages, the entire Ru deposit is in the reacted state while a small portion of the deposited Ir remains metallic. Ru and Ir bonding occur at the PR carbonyl sites as evidenced by the attenuation of carbonyl photoemission and the emergence of new peak assigned to C-O single bond. The curve fitting analysis and the derived stoichiometry indicates the formation of metallo-organic bonds. The co-existence of oxide bonds is also apparent.

    Original languageEnglish
    Title of host publicationElectrocatalysis 6
    PublisherElectrochemical Society Inc.
    Pages19-33
    Number of pages15
    Edition36
    ISBN (Print)9781607684244
    DOIs
    StatePublished - 2013
    EventSymposium on Electrocatalysis 6 - 22nd ECS Meeting/PRiME 2012 - Honolulu, HI, United States
    Duration: Oct 7 2012Oct 12 2012

    Publication series

    NameECS Transactions
    Number36
    Volume50
    ISSN (Print)1938-5862
    ISSN (Electronic)1938-6737

    Conference

    ConferenceSymposium on Electrocatalysis 6 - 22nd ECS Meeting/PRiME 2012
    Country/TerritoryUnited States
    CityHonolulu, HI
    Period10/7/1210/12/12

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