XPS and STEM study of the interface formation between Ultra-Thin Ru and Ir OER catalyst layers and perylene red support whiskers

L. L. Atanasoska, D. A. Cullen, A. E. Hester, R. T. Atanasoski

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

The interface formation between perylene red (PR) and ruthenium or iridium OER catalysts has been studied systematically by XPS and STEM. The OER catalyst over-layers with thicknesses ranging from ∼0.1 to ∼50 nm were vapor deposited onto PR ex-situ. As seen by STEM, Ru and Ir form into nanoparticles, which agglomerate with increased loading. XPS data show a strong interaction between Ru and PR. Ir also interacts with PR although not to the extent seen for Ru. At low coverages, the entire Ru deposit is in the reacted state while a small portion of the deposited Ir remains metallic. Ru and Ir bonding occur at the PR carbonyl sites as evidenced by the attenuation of carbonyl photoemission and the emergence of new peak assigned to C-O single bond. The curve fitting analysis and the derived stoichiometry indicates the formation of metallo-organic bonds. The co-existence of oxide bonds is also apparent.

Original languageEnglish
Title of host publicationElectrocatalysis 6
PublisherElectrochemical Society Inc.
Pages19-33
Number of pages15
Edition36
ISBN (Print)9781607684244
DOIs
StatePublished - 2013
EventSymposium on Electrocatalysis 6 - 22nd ECS Meeting/PRiME 2012 - Honolulu, HI, United States
Duration: Oct 7 2012Oct 12 2012

Publication series

NameECS Transactions
Number36
Volume50
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Conference

ConferenceSymposium on Electrocatalysis 6 - 22nd ECS Meeting/PRiME 2012
Country/TerritoryUnited States
CityHonolulu, HI
Period10/7/1210/12/12

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