X-ray spectrum imaging of sintering additives in thick-film (Pb, La)(Zr, Ti)O3

X-ray spectrum imaging of sintering additives in thick-film (Pb, La)(Zr, Ti)O₃

C. M. Parish, B. B. McKenzie, M. R. Winter, B. A. Tuttle

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	770-771
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608081361
State	Published - Aug 2008

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title = "X-ray spectrum imaging of sintering additives in thick-film (Pb, La)(Zr, Ti)O3",

author = "Parish, \{C. M.\} and McKenzie, \{B. B.\} and Winter, \{M. R.\} and Tuttle, \{B. A.\}",

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T1 - X-ray spectrum imaging of sintering additives in thick-film (Pb, La)(Zr, Ti)O3

AU - Parish, C. M.

AU - McKenzie, B. B.

AU - Winter, M. R.

AU - Tuttle, B. A.

PY - 2008/8

Y1 - 2008/8

UR - https://www.scopus.com/pages/publications/49549095139

U2 - 10.1017/S1431927608081361

DO - 10.1017/S1431927608081361

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SN - 1431-9276

VL - 14

SP - 770

EP - 771

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -