X-ray scattering evidence for the structural nature of fatigue in epitaxial Pb(Zr, Ti)O3 films

Carol Thompson; A. Munkholm; S. K. Streiffer; G. B. Stephenson; K. Ghosh; J. A. Eastman; O. Auciello; G. R. Bai; M. K. Lee; C. B. Eom

doi:10.1063/1.1375001

X-ray scattering evidence for the structural nature of fatigue in epitaxial Pb(Zr, Ti)O₃ films

Carol Thompson, A. Munkholm, S. K. Streiffer, G. B. Stephenson, K. Ghosh, J. A. Eastman, O. Auciello, G. R. Bai, M. K. Lee, C. B. Eom

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

Abstract

We have probed the microscopic distribution of 180° domains as a function of switching history in 40 nm epitaxial films of Pb(Zr_0.30Ti_0.70)O₃ by analyzing interference effects in the x-ray scattering profiles. These as-grown films exhibit voltage offsets (imprint) in the polarization hysteresis loops, coupled with a strongly preferred polarization direction in the virgin state. Our x-ray results are consistent with models attributing the loss of switchable polarization to the inhibition of the formation of oppositely polarized domains in a unipolar matrix. Using such model epitaxial films, we demonstrate that different microscopic ensembles of domains resulting from, for example, fatigue, may be resolved by this technique.

Original language	English
Pages (from-to)	3511-3513
Number of pages	3
Journal	Applied Physics Letters
Volume	78
Issue number	22
DOIs	https://doi.org/10.1063/1.1375001
State	Published - May 28 2001
Externally published	Yes

Access to Document

10.1063/1.1375001

Cite this

@article{d1787981ac2b4d38b384245fcbc57593,

title = "X-ray scattering evidence for the structural nature of fatigue in epitaxial Pb(Zr, Ti)O3 films",

abstract = "We have probed the microscopic distribution of 180° domains as a function of switching history in 40 nm epitaxial films of Pb(Zr0.30Ti0.70)O3 by analyzing interference effects in the x-ray scattering profiles. These as-grown films exhibit voltage offsets (imprint) in the polarization hysteresis loops, coupled with a strongly preferred polarization direction in the virgin state. Our x-ray results are consistent with models attributing the loss of switchable polarization to the inhibition of the formation of oppositely polarized domains in a unipolar matrix. Using such model epitaxial films, we demonstrate that different microscopic ensembles of domains resulting from, for example, fatigue, may be resolved by this technique.",

author = "Carol Thompson and A. Munkholm and Streiffer, {S. K.} and Stephenson, {G. B.} and K. Ghosh and Eastman, {J. A.} and O. Auciello and Bai, {G. R.} and Lee, {M. K.} and Eom, {C. B.}",

year = "2001",

month = may,

day = "28",

doi = "10.1063/1.1375001",

language = "English",

volume = "78",

pages = "3511--3513",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "22",

}

TY - JOUR

T1 - X-ray scattering evidence for the structural nature of fatigue in epitaxial Pb(Zr, Ti)O3 films

AU - Thompson, Carol

AU - Munkholm, A.

AU - Streiffer, S. K.

AU - Stephenson, G. B.

AU - Ghosh, K.

AU - Eastman, J. A.

AU - Auciello, O.

AU - Bai, G. R.

AU - Lee, M. K.

AU - Eom, C. B.

PY - 2001/5/28

Y1 - 2001/5/28

N2 - We have probed the microscopic distribution of 180° domains as a function of switching history in 40 nm epitaxial films of Pb(Zr0.30Ti0.70)O3 by analyzing interference effects in the x-ray scattering profiles. These as-grown films exhibit voltage offsets (imprint) in the polarization hysteresis loops, coupled with a strongly preferred polarization direction in the virgin state. Our x-ray results are consistent with models attributing the loss of switchable polarization to the inhibition of the formation of oppositely polarized domains in a unipolar matrix. Using such model epitaxial films, we demonstrate that different microscopic ensembles of domains resulting from, for example, fatigue, may be resolved by this technique.

AB - We have probed the microscopic distribution of 180° domains as a function of switching history in 40 nm epitaxial films of Pb(Zr0.30Ti0.70)O3 by analyzing interference effects in the x-ray scattering profiles. These as-grown films exhibit voltage offsets (imprint) in the polarization hysteresis loops, coupled with a strongly preferred polarization direction in the virgin state. Our x-ray results are consistent with models attributing the loss of switchable polarization to the inhibition of the formation of oppositely polarized domains in a unipolar matrix. Using such model epitaxial films, we demonstrate that different microscopic ensembles of domains resulting from, for example, fatigue, may be resolved by this technique.

UR - http://www.scopus.com/inward/record.url?scp=0345818518&partnerID=8YFLogxK

U2 - 10.1063/1.1375001

DO - 10.1063/1.1375001

M3 - Article

AN - SCOPUS:0345818518

SN - 0003-6951

VL - 78

SP - 3511

EP - 3513

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 22

ER -

X-ray scattering evidence for the structural nature of fatigue in epitaxial Pb(Zr, Ti)O₃ films

Abstract

Access to Document

Other files and links

Fingerprint

Cite this