X-ray nanodiffraction of tilted domains in a poled epitaxial BiFeO 3 thin film

S. O. Hruszkewycz; C. M. Folkman; M. J. Highland; M. V. Holt; S. H. Baek; S. K. Streiffer; P. Baldo; C. B. Eom; P. H. Fuoss

doi:10.1063/1.3665627

X-ray nanodiffraction of tilted domains in a poled epitaxial BiFeO ₃ thin film

S. O. Hruszkewycz, C. M. Folkman, M. J. Highland, M. V. Holt, S. H. Baek, S. K. Streiffer, P. Baldo, C. B. Eom, P. H. Fuoss

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

We present measurements of crystallographic domain tilts in a (001) BiFeO ₃ thin film using focused beam x-ray nanodiffraction. Films were ferroelectrically pre-poled with an electric field orthogonal and parallel to as-grown tilt domain stripes. The tilt domains, associated with higher energy (010) vertical twin walls, displayed different nanostructural responses based on the poling orientation. Specifically, an electric field applied perpendicular to the as-grown domain stripe allowed the domain tilts and associated vertical twin walls to persist. The result demonstrates that thin film ferroelectric devices can be designed to maintain unexpected domain morphologies in working poled environments.

Original language	English
Article number	232903
Journal	Applied Physics Letters
Volume	99
Issue number	23
DOIs	https://doi.org/10.1063/1.3665627
State	Published - Dec 5 2011
Externally published	Yes

Funding

This work, including the use of the Center for Nanoscale Materials and the Advanced Photon Source, was supported by the U. S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. The work at UW-Madison was supported by Army Research Office under Grant No. W911NF-10-1-0362 and the National Science Foundation under Grant No. ECCS-0708759.

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title = "X-ray nanodiffraction of tilted domains in a poled epitaxial BiFeO 3 thin film",

abstract = "We present measurements of crystallographic domain tilts in a (001) BiFeO 3 thin film using focused beam x-ray nanodiffraction. Films were ferroelectrically pre-poled with an electric field orthogonal and parallel to as-grown tilt domain stripes. The tilt domains, associated with higher energy (010) vertical twin walls, displayed different nanostructural responses based on the poling orientation. Specifically, an electric field applied perpendicular to the as-grown domain stripe allowed the domain tilts and associated vertical twin walls to persist. The result demonstrates that thin film ferroelectric devices can be designed to maintain unexpected domain morphologies in working poled environments.",

author = "Hruszkewycz, {S. O.} and Folkman, {C. M.} and Highland, {M. J.} and Holt, {M. V.} and Baek, {S. H.} and Streiffer, {S. K.} and P. Baldo and Eom, {C. B.} and Fuoss, {P. H.}",

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AU - Hruszkewycz, S. O.

AU - Folkman, C. M.

AU - Highland, M. J.

AU - Holt, M. V.

AU - Baek, S. H.

AU - Streiffer, S. K.

AU - Baldo, P.

AU - Eom, C. B.

AU - Fuoss, P. H.

PY - 2011/12/5

Y1 - 2011/12/5

N2 - We present measurements of crystallographic domain tilts in a (001) BiFeO 3 thin film using focused beam x-ray nanodiffraction. Films were ferroelectrically pre-poled with an electric field orthogonal and parallel to as-grown tilt domain stripes. The tilt domains, associated with higher energy (010) vertical twin walls, displayed different nanostructural responses based on the poling orientation. Specifically, an electric field applied perpendicular to the as-grown domain stripe allowed the domain tilts and associated vertical twin walls to persist. The result demonstrates that thin film ferroelectric devices can be designed to maintain unexpected domain morphologies in working poled environments.

AB - We present measurements of crystallographic domain tilts in a (001) BiFeO 3 thin film using focused beam x-ray nanodiffraction. Films were ferroelectrically pre-poled with an electric field orthogonal and parallel to as-grown tilt domain stripes. The tilt domains, associated with higher energy (010) vertical twin walls, displayed different nanostructural responses based on the poling orientation. Specifically, an electric field applied perpendicular to the as-grown domain stripe allowed the domain tilts and associated vertical twin walls to persist. The result demonstrates that thin film ferroelectric devices can be designed to maintain unexpected domain morphologies in working poled environments.

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X-ray nanodiffraction of tilted domains in a poled epitaxial BiFeO ₃ thin film

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