X-ray Fraunhofer diffraction patterns from a thin-film waveguide

Y. P. Feng; S. K. Sinha; Eric E. Fullerton; G. Grübel; D. Abernathy; D. P. Siddons; J. B. Hastings

doi:10.1063/1.115346

X-ray Fraunhofer diffraction patterns from a thin-film waveguide

Y. P. Feng, S. K. Sinha, Eric E. Fullerton, G. Grübel, D. Abernathy, D. P. Siddons, J. B. Hastings

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59 Scopus citations

Abstract

We have observed the Fraunhofer diffraction pattern of x-rays exiting from the end face of a SiO₂/polyimide/Si thin-film waveguide. The measured angular intensity distributions are in excellent agreement with those calculated based on the dimensions and the refractive index profile of the guide. Our measurement confirms that, at the end face of the guide, the wavefront of a single guided mode is fully coherent in the direction normal to the guiding plane. This focused and transversely coherent x-ray beam may be used as a source for coherence-based experiments, such as x-ray photon correlation spectroscopy.

Original language	English
Pages (from-to)	3647
Number of pages	1
Journal	Applied Physics Letters
Volume	67
DOIs	https://doi.org/10.1063/1.115346
State	Published - 1995
Externally published	Yes

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title = "X-ray Fraunhofer diffraction patterns from a thin-film waveguide",

abstract = "We have observed the Fraunhofer diffraction pattern of x-rays exiting from the end face of a SiO2/polyimide/Si thin-film waveguide. The measured angular intensity distributions are in excellent agreement with those calculated based on the dimensions and the refractive index profile of the guide. Our measurement confirms that, at the end face of the guide, the wavefront of a single guided mode is fully coherent in the direction normal to the guiding plane. This focused and transversely coherent x-ray beam may be used as a source for coherence-based experiments, such as x-ray photon correlation spectroscopy.",

author = "Feng, {Y. P.} and Sinha, {S. K.} and Fullerton, {Eric E.} and G. Gr{\"u}bel and D. Abernathy and Siddons, {D. P.} and Hastings, {J. B.}",

year = "1995",

doi = "10.1063/1.115346",

language = "English",

volume = "67",

pages = "3647",

journal = "Applied Physics Letters",

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publisher = "American Institute of Physics",

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T1 - X-ray Fraunhofer diffraction patterns from a thin-film waveguide

AU - Feng, Y. P.

AU - Sinha, S. K.

AU - Fullerton, Eric E.

AU - Grübel, G.

AU - Abernathy, D.

AU - Siddons, D. P.

AU - Hastings, J. B.

PY - 1995

Y1 - 1995

N2 - We have observed the Fraunhofer diffraction pattern of x-rays exiting from the end face of a SiO2/polyimide/Si thin-film waveguide. The measured angular intensity distributions are in excellent agreement with those calculated based on the dimensions and the refractive index profile of the guide. Our measurement confirms that, at the end face of the guide, the wavefront of a single guided mode is fully coherent in the direction normal to the guiding plane. This focused and transversely coherent x-ray beam may be used as a source for coherence-based experiments, such as x-ray photon correlation spectroscopy.

AB - We have observed the Fraunhofer diffraction pattern of x-rays exiting from the end face of a SiO2/polyimide/Si thin-film waveguide. The measured angular intensity distributions are in excellent agreement with those calculated based on the dimensions and the refractive index profile of the guide. Our measurement confirms that, at the end face of the guide, the wavefront of a single guided mode is fully coherent in the direction normal to the guiding plane. This focused and transversely coherent x-ray beam may be used as a source for coherence-based experiments, such as x-ray photon correlation spectroscopy.

UR - http://www.scopus.com/inward/record.url?scp=36449004484&partnerID=8YFLogxK

U2 - 10.1063/1.115346

DO - 10.1063/1.115346

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AN - SCOPUS:36449004484

SN - 0003-6951

VL - 67

SP - 3647

JO - Applied Physics Letters

JF - Applied Physics Letters

ER -

X-ray Fraunhofer diffraction patterns from a thin-film waveguide

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