X-ray diffraction data and analysis to support phase identification in FeSe and Fe7Se8 epitaxial thin films

Sumner B. Harris; Renato P. Camata

doi:10.1016/j.dib.2019.104778

X-ray diffraction data and analysis to support phase identification in FeSe and Fe₇Se₈ epitaxial thin films

Sumner B. Harris, Renato P. Camata

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

X-ray diffraction (XRD) data and analysis for epitaxial iron selenide thin films grown by pulsed laser deposition (PLD) are presented to support the conclusions in the related research article “Double epitaxy of tetragonal and hexagonal phases in the FeSe system” [1]. The films contain β-FeSe and Fe₇Se₈ phases in a double epitaxy configuration with the β-FeSe phase (001) oriented on the (001) MgO growth substrate. Fe₇Se₈ simultaneously takes on two different epitaxial orientations in certain growth conditions, exhibiting both (101)- and (001)- orientations. Each of these orientations are verified with the presented XRD data. Additionally, XRD data used to determine the PLD target composition as well as mosaic structure of the β-FeSe phase are shown.

Original language	English
Article number	104778
Journal	Data in Brief
Volume	27
DOIs	https://doi.org/10.1016/j.dib.2019.104778
State	Published - Dec 2019
Externally published	Yes

Funding

SBH acknowledges graduate fellowship support from the NASA Alabama Space Grant Consortium (ASGC) under award NNX15AJ18H . This work was supported in part by the Air Force Office of Scientific Research under award FA9550-13-1-0234 and by the NSF Major Research Instrumentation (MRI) Grant No. DMR-1725016 . Any opinions, findings, and conclusions or recommendations expressed in this material are those of the authors and do not necessarily reflect the views of the National Science Foundation or the Air Force Office of Scientific Research. SBH acknowledges graduate fellowship support from the NASA Alabama Space Grant Consortium (ASGC) under award NNX15AJ18H. This work was supported in part by the Air Force Office of Scientific Research under award FA9550-13-1-0234 and by the NSF Major Research Instrumentation (MRI) Grant No. DMR-1725016. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the authors and do not necessarily reflect the views of the National Science Foundation or the Air Force Office of Scientific Research.

Funders	Funder number
NSF Major Research Instrumentation	MRI
National Science Foundation	DMR-1725016
Directorate for Mathematical and Physical Sciences	1725016
Air Force Office of Scientific Research	FA9550-13-1-0234
Alabama Space Grant Consortium	NNX15AJ18H

Keywords

Double epitaxy
Fe7Se8
FeSe
Iron selenide
Iron-based superconductor

Access to Document

10.1016/j.dib.2019.104778

Cite this

@article{d9fc5546ca6e490cb8edb01fd382c6d2,

title = "X-ray diffraction data and analysis to support phase identification in FeSe and Fe7Se8 epitaxial thin films",

abstract = "X-ray diffraction (XRD) data and analysis for epitaxial iron selenide thin films grown by pulsed laser deposition (PLD) are presented to support the conclusions in the related research article “Double epitaxy of tetragonal and hexagonal phases in the FeSe system” [1]. The films contain β-FeSe and Fe7Se8 phases in a double epitaxy configuration with the β-FeSe phase (001) oriented on the (001) MgO growth substrate. Fe7Se8 simultaneously takes on two different epitaxial orientations in certain growth conditions, exhibiting both (101)- and (001)- orientations. Each of these orientations are verified with the presented XRD data. Additionally, XRD data used to determine the PLD target composition as well as mosaic structure of the β-FeSe phase are shown.",

keywords = "Double epitaxy, Fe7Se8, FeSe, Iron selenide, Iron-based superconductor",

author = "Harris, {Sumner B.} and Camata, {Renato P.}",

note = "Publisher Copyright: {\textcopyright} 2019 The Authors",

year = "2019",

month = dec,

doi = "10.1016/j.dib.2019.104778",

language = "English",

volume = "27",

journal = "Data in Brief",

issn = "2352-3409",

publisher = "Elsevier",

}

TY - JOUR

T1 - X-ray diffraction data and analysis to support phase identification in FeSe and Fe7Se8 epitaxial thin films

AU - Harris, Sumner B.

AU - Camata, Renato P.

PY - 2019/12

Y1 - 2019/12

N2 - X-ray diffraction (XRD) data and analysis for epitaxial iron selenide thin films grown by pulsed laser deposition (PLD) are presented to support the conclusions in the related research article “Double epitaxy of tetragonal and hexagonal phases in the FeSe system” [1]. The films contain β-FeSe and Fe7Se8 phases in a double epitaxy configuration with the β-FeSe phase (001) oriented on the (001) MgO growth substrate. Fe7Se8 simultaneously takes on two different epitaxial orientations in certain growth conditions, exhibiting both (101)- and (001)- orientations. Each of these orientations are verified with the presented XRD data. Additionally, XRD data used to determine the PLD target composition as well as mosaic structure of the β-FeSe phase are shown.

AB - X-ray diffraction (XRD) data and analysis for epitaxial iron selenide thin films grown by pulsed laser deposition (PLD) are presented to support the conclusions in the related research article “Double epitaxy of tetragonal and hexagonal phases in the FeSe system” [1]. The films contain β-FeSe and Fe7Se8 phases in a double epitaxy configuration with the β-FeSe phase (001) oriented on the (001) MgO growth substrate. Fe7Se8 simultaneously takes on two different epitaxial orientations in certain growth conditions, exhibiting both (101)- and (001)- orientations. Each of these orientations are verified with the presented XRD data. Additionally, XRD data used to determine the PLD target composition as well as mosaic structure of the β-FeSe phase are shown.

KW - Double epitaxy

KW - Fe7Se8

KW - FeSe

KW - Iron selenide

KW - Iron-based superconductor

UR - http://www.scopus.com/inward/record.url?scp=85074899781&partnerID=8YFLogxK

U2 - 10.1016/j.dib.2019.104778

DO - 10.1016/j.dib.2019.104778

M3 - Article

AN - SCOPUS:85074899781

SN - 2352-3409

VL - 27

JO - Data in Brief

JF - Data in Brief

M1 - 104778

ER -