X-ray analysis of strain relaxed domain structure in (100)/(001)-oriented epitaxial PbTiO3 thick films grown on (100)SrTiO3 substrates

Hiroshi Nakaki; Kwan Kim Yong; Shintaro Yokoyama; Rikyu Ikariyama; Hiroshi Funakubo; S. K. Streiffer; Ken Nishida; Keisuke Saito

X-ray analysis of strain relaxed domain structure in (100)/(001)-oriented epitaxial PbTiO₃ thick films grown on (100)SrTiO₃ substrates

Hiroshi Nakaki, Kwan Kim Yong, Shintaro Yokoyama, Rikyu Ikariyama, Hiroshi Funakubo, S. K. Streiffer, Ken Nishida, Keisuke Saito

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The crystal and domain structures of epitaxially grown (100)/(001)-oriented PbTiO₃ films on (100)SrTiO₃ substrates with 3.8 μm thickness were investigated by x-ray diffraction (XRD) reciprocal space mapping. The observed poles of the PbTiO₃ 004, 400, 204, 402 and 420 can be successfully explained using a model with one type of (001) domain and three types of (100) domains. Good agreement is also found between the domain estimation from scanning probe microscopy and that from the in-plane and out-of-plane XRD analysis.

Original language	English
Title of host publication	Ferroelectrics, Multiferroics, and Magnetoelectrics
Pages	127-132
Number of pages	6
State	Published - 2008
Externally published	Yes
Event	2007 MRS Fall Meeting - Boston, MA, United States Duration: Nov 26 2007 → Nov 30 2007

Publication series

Name	Materials Research Society Symposium Proceedings
Volume	1034
ISSN (Print)	0272-9172

Conference

Conference	2007 MRS Fall Meeting
Country/Territory	United States
City	Boston, MA
Period	11/26/07 → 11/30/07

Cite this

Nakaki, H., Yong, K. K., Yokoyama, S., Ikariyama, R., Funakubo, H., Streiffer, S. K., Nishida, K., & Saito, K. (2008). X-ray analysis of strain relaxed domain structure in (100)/(001)-oriented epitaxial PbTiO₃ thick films grown on (100)SrTiO₃ substrates. In Ferroelectrics, Multiferroics, and Magnetoelectrics (pp. 127-132). (Materials Research Society Symposium Proceedings; Vol. 1034).

@inproceedings{c82dd2fa5d0c47758a3a8eea0ea05826,

title = "X-ray analysis of strain relaxed domain structure in (100)/(001)-oriented epitaxial PbTiO3 thick films grown on (100)SrTiO3 substrates",

abstract = "The crystal and domain structures of epitaxially grown (100)/(001)-oriented PbTiO3 films on (100)SrTiO3 substrates with 3.8 μm thickness were investigated by x-ray diffraction (XRD) reciprocal space mapping. The observed poles of the PbTiO3 004, 400, 204, 402 and 420 can be successfully explained using a model with one type of (001) domain and three types of (100) domains. Good agreement is also found between the domain estimation from scanning probe microscopy and that from the in-plane and out-of-plane XRD analysis.",

author = "Hiroshi Nakaki and Yong, {Kwan Kim} and Shintaro Yokoyama and Rikyu Ikariyama and Hiroshi Funakubo and Streiffer, {S. K.} and Ken Nishida and Keisuke Saito",

year = "2008",

language = "English",

isbn = "9781605608297",

series = "Materials Research Society Symposium Proceedings",

pages = "127--132",

booktitle = "Ferroelectrics, Multiferroics, and Magnetoelectrics",

note = "2007 MRS Fall Meeting ; Conference date: 26-11-2007 Through 30-11-2007",

}

Nakaki, H, Yong, KK, Yokoyama, S, Ikariyama, R, Funakubo, H, Streiffer, SK, Nishida, K & Saito, K 2008, X-ray analysis of strain relaxed domain structure in (100)/(001)-oriented epitaxial PbTiO₃ thick films grown on (100)SrTiO₃ substrates. in Ferroelectrics, Multiferroics, and Magnetoelectrics. Materials Research Society Symposium Proceedings, vol. 1034, pp. 127-132, 2007 MRS Fall Meeting, Boston, MA, United States, 11/26/07.

X-ray analysis of strain relaxed domain structure in (100)/(001)-oriented epitaxial PbTiO₃ thick films grown on (100)SrTiO₃ substrates. / Nakaki, Hiroshi; Yong, Kwan Kim; Yokoyama, Shintaro et al.
Ferroelectrics, Multiferroics, and Magnetoelectrics. 2008. p. 127-132 (Materials Research Society Symposium Proceedings; Vol. 1034).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - X-ray analysis of strain relaxed domain structure in (100)/(001)-oriented epitaxial PbTiO3 thick films grown on (100)SrTiO3 substrates

AU - Nakaki, Hiroshi

AU - Yong, Kwan Kim

AU - Yokoyama, Shintaro

AU - Ikariyama, Rikyu

AU - Funakubo, Hiroshi

AU - Streiffer, S. K.

AU - Nishida, Ken

AU - Saito, Keisuke

PY - 2008

Y1 - 2008

N2 - The crystal and domain structures of epitaxially grown (100)/(001)-oriented PbTiO3 films on (100)SrTiO3 substrates with 3.8 μm thickness were investigated by x-ray diffraction (XRD) reciprocal space mapping. The observed poles of the PbTiO3 004, 400, 204, 402 and 420 can be successfully explained using a model with one type of (001) domain and three types of (100) domains. Good agreement is also found between the domain estimation from scanning probe microscopy and that from the in-plane and out-of-plane XRD analysis.

AB - The crystal and domain structures of epitaxially grown (100)/(001)-oriented PbTiO3 films on (100)SrTiO3 substrates with 3.8 μm thickness were investigated by x-ray diffraction (XRD) reciprocal space mapping. The observed poles of the PbTiO3 004, 400, 204, 402 and 420 can be successfully explained using a model with one type of (001) domain and three types of (100) domains. Good agreement is also found between the domain estimation from scanning probe microscopy and that from the in-plane and out-of-plane XRD analysis.

UR - http://www.scopus.com/inward/record.url?scp=70350327788&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:70350327788

SN - 9781605608297

T3 - Materials Research Society Symposium Proceedings

SP - 127

EP - 132

BT - Ferroelectrics, Multiferroics, and Magnetoelectrics

T2 - 2007 MRS Fall Meeting

Y2 - 26 November 2007 through 30 November 2007

ER -

X-ray analysis of strain relaxed domain structure in (100)/(001)-oriented epitaxial PbTiO₃ thick films grown on (100)SrTiO₃ substrates

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