Working distance passive stability in laser directed energy deposition additive manufacturing

James C. Haley, Baolong Zheng, Umberto Scipioni Bertoli, Alexander D. Dupuy, Julie M. Schoenung, Enrique J. Lavernia

Research output: Contribution to journalArticlepeer-review

85 Scopus citations

Abstract

In Laser Directed Energy Deposition (L-DED), closed loop control systems can be used to enhance system reliability; however, modulating controlled parameters can have unintended secondary morphological and microstructural effects. To enable development of control systems more sensitive to the complicated interplay between powder flow, thermal transfer, and long-term stability in the machine, the L-DED process, in an open loop configuration, was studied both experimentally and theoretically. A fully physics based semi-analytical model was created that incorporates descriptions of the powder spray pattern, laser attenuation through the powder cloud, and a thermal equilibrium model to predict melt dimensions. The model was validated against an experimental matrix of 258 single track deposition experiments with stainless steel 316 L. It was found that the powder flow field causes working distance (WD) to converge to an equilibrium value, and that this equilibrium position is strongly influenced by many effects, such as thermal energy accumulation in the part and powder flow dispersion. Several metrics to quantify the stability of this equilibrium working distance are proposed and discussed.

Original languageEnglish
Pages (from-to)86-94
Number of pages9
JournalMaterials and Design
Volume161
DOIs
StatePublished - Jan 5 2019
Externally publishedYes

Funding

This work was supported by Sandia National Laboratories [ 1687547 ] and the Army Research Office [Grant W911NF1810279 ].

FundersFunder number
Army Research OfficeW911NF1810279
Sandia National Laboratories1687547

    Keywords

    • Additive manufacturing
    • Austenitic stainless steel
    • Directed energy deposition
    • Powder capture efficiency
    • Powder flow characterization
    • Process control

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