White-beam X-ray diffraction and radiography studies on high-boron-containing borosilicate glass at high pressures

Kathryn J. Ham; Yogesh K. Vohra; Yoshio Kono; Andrew A. Wereszczak; Parimal Patel

doi:10.1080/08957959.2017.1287263

White-beam X-ray diffraction and radiography studies on high-boron-containing borosilicate glass at high pressures

Kathryn J. Ham, Yogesh K. Vohra, Yoshio Kono, Andrew A. Wereszczak, Parimal Patel

Mechanical Properties and Mechanics

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Multi-angle energy-dispersive X-ray diffraction studies and white-beam X-ray radiography were conducted with a cylindrically shaped (1 mm diameter and 0.7 mm high) high-boron-content borosilicate glass sample (17.6% B₂O₃) to a pressure of 13.7 GPa using a Paris-Edinburgh (PE) press at Beamline 16-BM-B, HPCAT of the Advanced Photon Source. The measured structure factor S(q) to large q = 19 Å⁻¹ is used to determine information about the internuclear bond distances between various species of atoms within the glass sample. Sample pressure was determined with gold as a pressure standard. The sample height as measured by radiography showed an overall uniaxial compression of 22.5% at 13.7 GPa with 10.6% permanent compaction after decompression to ambient conditions. The reduced pair distribution function G(r) was extracted and Si–O, O–O and Si–Si bond distances were measured as a function of pressure. Raman spectroscopy of the pressure recovered sample as compared to starting material showed blue-shift and changes in intensity and widths of Raman bands associated with silicate and four-coordinated boron.

Original language	English
Pages (from-to)	233-243
Number of pages	11
Journal	High Pressure Research
Volume	37
Issue number	2
DOIs	https://doi.org/10.1080/08957959.2017.1287263
State	Published - Apr 3 2017

Funding

The authors acknowledge support from the US Army Research Office under grant no. W911NF-15-1-0614 through the University of Tennessee–Knoxville. Kathryn Ham is supported by the Carnegie DOE Alliance Center (CDAC) under grant number DE-NA002006. Portions of this work were performed at HPCAT (Sector 16), Advanced Photon Source (APS), Argonne National Laboratory. HPCAT operations are supported by DOE-NNSA under award no. DE-NA0001974 and DOE-BES under award no. DE-FG02-99ER45775, with partial instrumentation funding by NSF. APS is supported by DOE-BES, under Contract No. DE-AC02-06CH11357.

Funders	Funder number
Carnegie DOE Alliance Center	DE-NA002006
National Science Foundation	DE-AC02-06CH11357
Army Research Office	W911NF-15-1-0614
Basic Energy Sciences	DE-FG02-99ER45775
National Nuclear Security Administration	DE-NA0001974
Argonne National Laboratory
University of Tennessee

Keywords

Borosilicate glass
Paris-Edinburgh cell
X-ray diffraction
high pressure

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10.1080/08957959.2017.1287263

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title = "White-beam X-ray diffraction and radiography studies on high-boron-containing borosilicate glass at high pressures",

abstract = "Multi-angle energy-dispersive X-ray diffraction studies and white-beam X-ray radiography were conducted with a cylindrically shaped (1 mm diameter and 0.7 mm high) high-boron-content borosilicate glass sample (17.6% B2O3) to a pressure of 13.7 GPa using a Paris-Edinburgh (PE) press at Beamline 16-BM-B, HPCAT of the Advanced Photon Source. The measured structure factor S(q) to large q = 19 {\AA}−1 is used to determine information about the internuclear bond distances between various species of atoms within the glass sample. Sample pressure was determined with gold as a pressure standard. The sample height as measured by radiography showed an overall uniaxial compression of 22.5% at 13.7 GPa with 10.6% permanent compaction after decompression to ambient conditions. The reduced pair distribution function G(r) was extracted and Si–O, O–O and Si–Si bond distances were measured as a function of pressure. Raman spectroscopy of the pressure recovered sample as compared to starting material showed blue-shift and changes in intensity and widths of Raman bands associated with silicate and four-coordinated boron.",

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AU - Patel, Parimal

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N2 - Multi-angle energy-dispersive X-ray diffraction studies and white-beam X-ray radiography were conducted with a cylindrically shaped (1 mm diameter and 0.7 mm high) high-boron-content borosilicate glass sample (17.6% B2O3) to a pressure of 13.7 GPa using a Paris-Edinburgh (PE) press at Beamline 16-BM-B, HPCAT of the Advanced Photon Source. The measured structure factor S(q) to large q = 19 Å−1 is used to determine information about the internuclear bond distances between various species of atoms within the glass sample. Sample pressure was determined with gold as a pressure standard. The sample height as measured by radiography showed an overall uniaxial compression of 22.5% at 13.7 GPa with 10.6% permanent compaction after decompression to ambient conditions. The reduced pair distribution function G(r) was extracted and Si–O, O–O and Si–Si bond distances were measured as a function of pressure. Raman spectroscopy of the pressure recovered sample as compared to starting material showed blue-shift and changes in intensity and widths of Raman bands associated with silicate and four-coordinated boron.

AB - Multi-angle energy-dispersive X-ray diffraction studies and white-beam X-ray radiography were conducted with a cylindrically shaped (1 mm diameter and 0.7 mm high) high-boron-content borosilicate glass sample (17.6% B2O3) to a pressure of 13.7 GPa using a Paris-Edinburgh (PE) press at Beamline 16-BM-B, HPCAT of the Advanced Photon Source. The measured structure factor S(q) to large q = 19 Å−1 is used to determine information about the internuclear bond distances between various species of atoms within the glass sample. Sample pressure was determined with gold as a pressure standard. The sample height as measured by radiography showed an overall uniaxial compression of 22.5% at 13.7 GPa with 10.6% permanent compaction after decompression to ambient conditions. The reduced pair distribution function G(r) was extracted and Si–O, O–O and Si–Si bond distances were measured as a function of pressure. Raman spectroscopy of the pressure recovered sample as compared to starting material showed blue-shift and changes in intensity and widths of Raman bands associated with silicate and four-coordinated boron.

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White-beam X-ray diffraction and radiography studies on high-boron-containing borosilicate glass at high pressures

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