Abstract
In this work, we demonstrate a well-posed compact model for phase change memory (PCM) devices based on Ge 2 Sb 2 Te 5 , (GST) chalcogenide. This model supports all modes of simulation including transient, DC, and AC. The model is developed in Verilog-A and simulated using HSPICE. It is computationally simple and successfully captures the key high level behaviors of memory switching, including the resistance dependence on programming voltages, currents and pulse time-scales.
| Original language | English |
|---|---|
| Title of host publication | SISPAD 2018 - 2018 International Conference on Simulation of Semiconductor Processes and Devices, Proceedings |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 369-373 |
| Number of pages | 5 |
| ISBN (Electronic) | 9781538667880 |
| DOIs | |
| State | Published - Nov 28 2018 |
| Externally published | Yes |
| Event | 2018 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2018 - Austin, United States Duration: Sep 24 2018 → Sep 26 2018 |
Publication series
| Name | International Conference on Simulation of Semiconductor Processes and Devices, SISPAD |
|---|---|
| Volume | 2018-September |
Conference
| Conference | 2018 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2018 |
|---|---|
| Country/Territory | United States |
| City | Austin |
| Period | 09/24/18 → 09/26/18 |
Funding
ACKNOWLEDGEMENTS This work was supported in part by the Semiconductor Research Corporation under grant number 2016-SD-2717, the CAMPUSENSE project grant from CISCO Systems Inc; and the National Science Foundation grant 1710009.
Keywords
- Phase change memory
- Verilog-A
- chalcogenide
- well-posed model