TY - GEN
T1 - Well-Posed Verilog-A Compact Model for Phase Change Memory
AU - Kulkarni, Shruti R.
AU - Kadetotad, Deepak Vinayak
AU - Seo, Jae Sun
AU - Rajendran, Bipin
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/11/28
Y1 - 2018/11/28
N2 - In this work, we demonstrate a well-posed compact model for phase change memory (PCM) devices based on Ge 2 Sb 2 Te 5 , (GST) chalcogenide. This model supports all modes of simulation including transient, DC, and AC. The model is developed in Verilog-A and simulated using HSPICE. It is computationally simple and successfully captures the key high level behaviors of memory switching, including the resistance dependence on programming voltages, currents and pulse time-scales.
AB - In this work, we demonstrate a well-posed compact model for phase change memory (PCM) devices based on Ge 2 Sb 2 Te 5 , (GST) chalcogenide. This model supports all modes of simulation including transient, DC, and AC. The model is developed in Verilog-A and simulated using HSPICE. It is computationally simple and successfully captures the key high level behaviors of memory switching, including the resistance dependence on programming voltages, currents and pulse time-scales.
KW - Phase change memory
KW - Verilog-A
KW - chalcogenide
KW - well-posed model
UR - http://www.scopus.com/inward/record.url?scp=85059748220&partnerID=8YFLogxK
U2 - 10.1109/SISPAD.2018.8551667
DO - 10.1109/SISPAD.2018.8551667
M3 - Conference contribution
AN - SCOPUS:85059748220
T3 - International Conference on Simulation of Semiconductor Processes and Devices, SISPAD
SP - 369
EP - 373
BT - SISPAD 2018 - 2018 International Conference on Simulation of Semiconductor Processes and Devices, Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2018 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2018
Y2 - 24 September 2018 through 26 September 2018
ER -