Water adsorption, dissociation and oxidation on SrTiO3 and ferroelectric surfaces revealed by ambient pressure X-ray photoelectron spectroscopy

Neus Domingo, Elzbieta Pach, Kumara Cordero-Edwards, Virginia Pérez-Dieste, Carlos Escudero, Albert Verdaguer

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Abstract

Water dissociation on oxides is of great interest because its fundamental aspects are still not well understood and it has implications in many processes, from ferroelectric polarization screening phenomena to surface catalysis and surface chemistry on oxides. In situ water dissociation and redox processes on metal oxide perovskites which easily expose TiO2-terminated surfaces, such as SrTiO3, BaTiO3 or Pb(Zr,Ti)O3, are studied by ambient pressure XPS, as a function of water vapour pressure. From the analysis of the O1s spectrum, we determine the presence of different types of oxygen based species, from hydroxyl groups, either bound to Ti4+ and metal sites or lattice oxygen, to different peroxide compounds, and propose a model for the adsorbate layer composition, valid for environmental conditions. From the XPS analysis, we describe the existing surface redox reactions for metal oxide perovskites, occurring at different water vapour pressures. Among them, peroxide species resulting from surface oxidative reactions are correlated with the presence of Ti4+ ions, which are observed to specifically promote surface oxidation and water dissociation as compared to other metals. Finally, surface peroxidation is enhanced by X-ray beam irradiation, leading to a higher coverage of peroxide species after beam overexposure and by ferroelectric polarization, demonstrating the enhancement of the reactivity of the surfaces of ferroelectric materials due to the effect of internal electric fields.

Original languageEnglish
Pages (from-to)4920-4930
Number of pages11
JournalPhysical Chemistry Chemical Physics
Volume21
Issue number9
DOIs
StatePublished - 2019
Externally publishedYes

Funding

The authors would like to acknowledge Prof. P. Paruch of Universitéde Genève, who kindly provided PZT thin film samples and Prof. B. Noheda for kindly providing BFO thin films. Financial support was provided by the Spanish Ministerio de Economía y Competitividad (MINECO) under projects FIS2015-73932-JIN and MAT2016-77852-C2-1-R (AEI/FEDER, UE). ICN2 is supported by the Severo Ochoa program from Spanish MINECO (Grant No. SEV-2017-0706), and ICMAB acknowledges support from the Severo Ochoa Program of MINECO (Grant No. SEV-2015-0496). This work was partially funded by 2017-SGR-579 and 2017-SGR-668 projects from the Generalitat de Catalunya. The authors would like to thank for the support of ALBA staff for the successful performance of the measurements at the CIRCE beam-line from the ALBA Synchrotron Light Source.

FundersFunder number
AEI/FEDER2017-SGR-668, SEV-2015-0496, SEV-2017-0706, 2017-SGR-579
Generalitat de Catalunya
Ministerio de Economía y CompetitividadFIS2015-73932-JIN, MAT2016-77852-C2-1-R

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