Visualizing nano-electromechanics by vector piezoresponse force microscopy

B. J. Rodriguez; S. Jesse; A. P. Baddorf; S. V. Kalinin; A. Gruverman

Visualizing nano-electromechanics by vector piezoresponse force microscopy

B. J. Rodriguez, S. Jesse, A. P. Baddorf, S. V. Kalinin, A. Gruverman

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

A novel approach for nanoscale imaging and presentation of the orientation dependence of electromechanical properties, vector piezoresponse force microscopy (Vector-PFM), is proposed. The relationship between local polarization, piezoelectric constants and crystallographic orientation is described. The image formation mechanism in vector PFM and conditions for complete three-dimensional (3D) reconstruction of the electromechanical response vector and evaluation of the piezoelectric constants from PFM data are discussed. The developed approach can be applied to crystallographic orientation imaging in piezoelectric materials with a spatial resolution below 10 nm. Several approaches for data representation in two-dimensional (2D)-PFM and 3D-PFM are described.

Original language	English
Title of host publication	2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings
Editors	M. Laudon, B. Romanowicz
Pages	667-670
Number of pages	4
State	Published - 2005
Event	2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 - Anaheim, CA, United States Duration: May 8 2005 → May 12 2005

Publication series

Name	2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings

Conference

Conference	2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005
Country/Territory	United States
City	Anaheim, CA
Period	05/8/05 → 05/12/05

Keywords

Piezo response force microscopy
Scanning probe microscopy
Vector PFM

Cite this

Rodriguez, B. J., Jesse, S., Baddorf, A. P., Kalinin, S. V., & Gruverman, A. (2005). Visualizing nano-electromechanics by vector piezoresponse force microscopy. In M. Laudon, & B. Romanowicz (Eds.), 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings (pp. 667-670). (2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings).

Rodriguez, B. J. ; Jesse, S. ; Baddorf, A. P. et al. / Visualizing nano-electromechanics by vector piezoresponse force microscopy. 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings. editor / M. Laudon ; B. Romanowicz. 2005. pp. 667-670 (2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings).

@inproceedings{e6be5aa199c946d08c58edc9eecda8de,

title = "Visualizing nano-electromechanics by vector piezoresponse force microscopy",

abstract = "A novel approach for nanoscale imaging and presentation of the orientation dependence of electromechanical properties, vector piezoresponse force microscopy (Vector-PFM), is proposed. The relationship between local polarization, piezoelectric constants and crystallographic orientation is described. The image formation mechanism in vector PFM and conditions for complete three-dimensional (3D) reconstruction of the electromechanical response vector and evaluation of the piezoelectric constants from PFM data are discussed. The developed approach can be applied to crystallographic orientation imaging in piezoelectric materials with a spatial resolution below 10 nm. Several approaches for data representation in two-dimensional (2D)-PFM and 3D-PFM are described.",

keywords = "Piezo response force microscopy, Scanning probe microscopy, Vector PFM",

author = "Rodriguez, {B. J.} and S. Jesse and Baddorf, {A. P.} and Kalinin, {S. V.} and A. Gruverman",

year = "2005",

language = "English",

isbn = "0976798514",

series = "2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings",

pages = "667--670",

editor = "M. Laudon and B. Romanowicz",

booktitle = "2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings",

note = "2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 ; Conference date: 08-05-2005 Through 12-05-2005",

}

Rodriguez, BJ, Jesse, S , Baddorf, AP, Kalinin, SV & Gruverman, A 2005, Visualizing nano-electromechanics by vector piezoresponse force microscopy. in M Laudon & B Romanowicz (eds), 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings. 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings, pp. 667-670, 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005, Anaheim, CA, United States, 05/8/05.

Visualizing nano-electromechanics by vector piezoresponse force microscopy. / Rodriguez, B. J.; Jesse, S.; Baddorf, A. P. et al.
2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings. ed. / M. Laudon; B. Romanowicz. 2005. p. 667-670 (2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Visualizing nano-electromechanics by vector piezoresponse force microscopy

AU - Rodriguez, B. J.

AU - Jesse, S.

AU - Baddorf, A. P.

AU - Kalinin, S. V.

AU - Gruverman, A.

PY - 2005

Y1 - 2005

N2 - A novel approach for nanoscale imaging and presentation of the orientation dependence of electromechanical properties, vector piezoresponse force microscopy (Vector-PFM), is proposed. The relationship between local polarization, piezoelectric constants and crystallographic orientation is described. The image formation mechanism in vector PFM and conditions for complete three-dimensional (3D) reconstruction of the electromechanical response vector and evaluation of the piezoelectric constants from PFM data are discussed. The developed approach can be applied to crystallographic orientation imaging in piezoelectric materials with a spatial resolution below 10 nm. Several approaches for data representation in two-dimensional (2D)-PFM and 3D-PFM are described.

AB - A novel approach for nanoscale imaging and presentation of the orientation dependence of electromechanical properties, vector piezoresponse force microscopy (Vector-PFM), is proposed. The relationship between local polarization, piezoelectric constants and crystallographic orientation is described. The image formation mechanism in vector PFM and conditions for complete three-dimensional (3D) reconstruction of the electromechanical response vector and evaluation of the piezoelectric constants from PFM data are discussed. The developed approach can be applied to crystallographic orientation imaging in piezoelectric materials with a spatial resolution below 10 nm. Several approaches for data representation in two-dimensional (2D)-PFM and 3D-PFM are described.

KW - Piezo response force microscopy

KW - Scanning probe microscopy

KW - Vector PFM

UR - http://www.scopus.com/inward/record.url?scp=32144433198&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:32144433198

SN - 0976798514

SN - 9780976798514

T3 - 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings

SP - 667

EP - 670

BT - 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings

A2 - Laudon, M.

A2 - Romanowicz, B.

T2 - 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005

Y2 - 8 May 2005 through 12 May 2005

ER -

Rodriguez BJ, Jesse S , Baddorf AP, Kalinin SV, Gruverman A. Visualizing nano-electromechanics by vector piezoresponse force microscopy. In Laudon M, Romanowicz B, editors, 2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings. 2005. p. 667-670. (2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings).

Visualizing nano-electromechanics by vector piezoresponse force microscopy

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Publication series

Conference

Keywords

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