VIRTUAL SLIT FOR IMPROVED RESOLUTION IN LONGITUDINAL EMITTANCE MEASUREMENT

K. Ruisard; A. Aleksandrov; A. Shishlo

doi:10.18429/JACoW-IBIC2020-THPP20

VIRTUAL SLIT FOR IMPROVED RESOLUTION IN LONGITUDINAL EMITTANCE MEASUREMENT

K. Ruisard, A. Aleksandrov, A. Shishlo

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

A technique to reduce point-spread originating from physical slit width in emittance measurements is described. This technique is developed to improve phase resolution in a longitudinal emittance apparatus consisting of a dipole magnet, energy-selecting slit and bunch shape monitor. In this apparatus, the energy and phase resolutions are directly proportional to the width of the slit. The virtual slit method allows sub-slit resolution, with penalty in measurement time and dynamic range. The bunch phase profile is measured at two points in the energy distribution with a separation less than the physical slit width. The difference of these two profiles is used to reconstruct the profile from a virtual slit of width equal to that separation.

Original language	English
Title of host publication	IBIC 2020 - Proceedings of the 9th International Beam Instrumentation Conference
Publisher	JACoW Publishing
Pages	241-245
Number of pages	5
ISBN (Electronic)	9783954502226
DOIs	https://doi.org/10.18429/JACoW-IBIC2020-THPP20
State	Published - 2020
Event	9th International Beam Instrumentation Conference, IBIC 2020 - Virtual, Online, Brazil Duration: Sep 14 2020 → Sep 18 2020

Publication series

Name	Proceedings of the International Beam Instrumentation Conference, IBIC
ISSN (Electronic)	2673-5350

Conference

Conference	9th International Beam Instrumentation Conference, IBIC 2020
Country/Territory	Brazil
City	Virtual, Online
Period	09/14/20 → 09/18/20

Funding

∗ This manuscript has been authored by UT-Battelle, LLC, under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy. The United States Government retains, and the publisher, by accepting the article for publication, acknowledges that the United States Government retains a non-exclusive, paid-up, irrevocable, world-wide license to pub-lish or reproduce the published form of this manuscript, or allow others to do so, for United States Government purposes. The Department of Energy will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan. † [email protected]

Funders	Funder number
U.S. Department of Energy

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10.18429/JACoW-IBIC2020-THPP20

Cite this

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title = "VIRTUAL SLIT FOR IMPROVED RESOLUTION IN LONGITUDINAL EMITTANCE MEASUREMENT",

abstract = "A technique to reduce point-spread originating from physical slit width in emittance measurements is described. This technique is developed to improve phase resolution in a longitudinal emittance apparatus consisting of a dipole magnet, energy-selecting slit and bunch shape monitor. In this apparatus, the energy and phase resolutions are directly proportional to the width of the slit. The virtual slit method allows sub-slit resolution, with penalty in measurement time and dynamic range. The bunch phase profile is measured at two points in the energy distribution with a separation less than the physical slit width. The difference of these two profiles is used to reconstruct the profile from a virtual slit of width equal to that separation.",

author = "K. Ruisard and A. Aleksandrov and A. Shishlo",

year = "2020",

doi = "10.18429/JACoW-IBIC2020-THPP20",

language = "English",

series = "Proceedings of the International Beam Instrumentation Conference, IBIC",

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pages = "241--245",

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Ruisard, K , Aleksandrov, A & Shishlo, A 2020, VIRTUAL SLIT FOR IMPROVED RESOLUTION IN LONGITUDINAL EMITTANCE MEASUREMENT. in IBIC 2020 - Proceedings of the 9th International Beam Instrumentation Conference. Proceedings of the International Beam Instrumentation Conference, IBIC, JACoW Publishing, pp. 241-245, 9th International Beam Instrumentation Conference, IBIC 2020, Virtual, Online, Brazil, 09/14/20. https://doi.org/10.18429/JACoW-IBIC2020-THPP20

VIRTUAL SLIT FOR IMPROVED RESOLUTION IN LONGITUDINAL EMITTANCE MEASUREMENT. / Ruisard, K.; Aleksandrov, A.; Shishlo, A.
IBIC 2020 - Proceedings of the 9th International Beam Instrumentation Conference. JACoW Publishing, 2020. p. 241-245 (Proceedings of the International Beam Instrumentation Conference, IBIC).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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N2 - A technique to reduce point-spread originating from physical slit width in emittance measurements is described. This technique is developed to improve phase resolution in a longitudinal emittance apparatus consisting of a dipole magnet, energy-selecting slit and bunch shape monitor. In this apparatus, the energy and phase resolutions are directly proportional to the width of the slit. The virtual slit method allows sub-slit resolution, with penalty in measurement time and dynamic range. The bunch phase profile is measured at two points in the energy distribution with a separation less than the physical slit width. The difference of these two profiles is used to reconstruct the profile from a virtual slit of width equal to that separation.

AB - A technique to reduce point-spread originating from physical slit width in emittance measurements is described. This technique is developed to improve phase resolution in a longitudinal emittance apparatus consisting of a dipole magnet, energy-selecting slit and bunch shape monitor. In this apparatus, the energy and phase resolutions are directly proportional to the width of the slit. The virtual slit method allows sub-slit resolution, with penalty in measurement time and dynamic range. The bunch phase profile is measured at two points in the energy distribution with a separation less than the physical slit width. The difference of these two profiles is used to reconstruct the profile from a virtual slit of width equal to that separation.

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DO - 10.18429/JACoW-IBIC2020-THPP20

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T3 - Proceedings of the International Beam Instrumentation Conference, IBIC

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BT - IBIC 2020 - Proceedings of the 9th International Beam Instrumentation Conference

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VIRTUAL SLIT FOR IMPROVED RESOLUTION IN LONGITUDINAL EMITTANCE MEASUREMENT

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