van der Waals Semiconductor Empowered Vertical Color Sensor

Ningxin Li, Aisha Okmi, Tara Jabegu, Hongkui Zheng, Kuangcai Chen, Alexander Lomashvili, Westley Williams, Diren Maraba, Ivan Kravchenko, Kai Xiao, Kai He, Sidong Lei

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

Biomimetic artificial vision is receiving significant attention nowadays, particularly for the development of neuromorphic electronic devices, artificial intelligence, and microrobotics. Nevertheless, color recognition, the most critical vision function, is missed in the current research due to the difficulty of downscaling of the prevailing color sensing devices. Conventional color sensors typically adopt a lateral color sensing channel layout and consume a large amount of physical space, whereas compact designs suffer from an unsatisfactory color detection accuracy. In this work, we report a van der Waals semiconductor-empowered vertical color sensing structure with the emphasis on compact device profile and precise color recognition capability. More attractive, we endow color sensor hardware with the function of chromatic aberration correction, which can simplify the design of an optical lens system and, in turn, further downscales the artificial vision systems. Also, the dimension of a multiple pixel prototype device in our study confirms the scalability and practical potentials of our developed device architecture toward the above applications.

Original languageEnglish
Pages (from-to)8619-8629
Number of pages11
JournalACS Nano
Volume16
Issue number6
DOIs
StatePublished - Jun 28 2022

Funding

The authors appreciate the inspiring discussion with Dr. Qingkun Liu, Department of Physics, Cornell University. The authors acknowledge Udagamage Kushan Wijewardena for his generous help for this work. O.A. acknowledges Jazan University, Saudi Arabia, for supporting her study at Georgia State University with a full scholarship. The authors acknowledge the use of Electron Microscopy Facility at Clemson University. This work is supported by a faculty start-up grant from Georgia State University and Research Initiation Grant (RIG) award of Georgia State University. A portion of this research was conducted at the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, which is a DOE Office of Science User Facility.

Keywords

  • chromatic aberration
  • color sensor
  • miniature artificial vision
  • stacking two-dimensional structure
  • van der Waals semiconductors

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