Abstract
Research on two-dimensional and layered materials has expanded over the past 2 decades because of their unique properties and application potential. The key hurdles in realizing this potential are the challenges in controlling their atomic structure and their incompatibility with existing semiconductor nanofabrication techniques. Here we report on high-quality van der Waals epitaxial growth and characterization of a layered topological insulator on freestanding monolayer graphene transferred to different mechanical supports. This "templated"synthesis approach enables direct interrogation of the interfacial atomic structure of the as-grown materials and opens a route toward creating device structures with more traditional semiconductor nanofabrication techniques.
Original language | English |
---|---|
Pages (from-to) | 7607-7613 |
Number of pages | 7 |
Journal | ACS Applied Nano Materials |
Volume | 4 |
Issue number | 8 |
DOIs | |
State | Published - Aug 27 2021 |
Funding
The authors acknowledge fruitful discussion with Felix Luepke. The MBE film synthesis and ARPES and STM work were supported by the U.S. Department of Energy (DOE), Office of Science, National Quantum Information Science Research Centers. The STM characterization was conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility. Electron microscopy and portions of the ARPES efforts were supported by the U.S. DOE, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division.
Funders | Funder number |
---|---|
ARPES | |
National Quantum Information Science Research Centers | |
U.S. Department of Energy | |
Office of Science | |
Basic Energy Sciences | |
Division of Materials Sciences and Engineering |
Keywords
- angle-resolved photoemission spectroscopy
- bismuth selenide
- graphene
- molecular beam epitaxy
- scanning transmission electron microscopy
- scanning tunneling microscopy
- topological insulator