Abstract
This paper presents a numerical solution for the unsteady transport of a dopant during the growth of a semiconductor crystal from a melt with an externally applied magnetic field. This solution confirms the results of an asymptotic model. Both solutions show that at every time during the growth of the crystal, the dopant distribution (1) is very nonuniform throughout the melt, and (2) is far from the instantaneous steady state. The present numerical solution for an arbitrary mass Péclet number Pem and an arbitrary Hartmann number Ha predicts a dopant distribution in the crystal, which agrees remarkably well with the dopant distribution predicted by the asymptotic solution for Pem ≫ 1 and Ha ≫ 1. The maximum difference between the crystal compositions predicted by these two different approaches is less than 4% for the range of magnetic field strengths considered.
Original language | English |
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Pages (from-to) | 401-409 |
Number of pages | 9 |
Journal | Journal of Crystal Growth |
Volume | 180 |
Issue number | 3-4 |
DOIs | |
State | Published - Oct 1997 |
Externally published | Yes |
Funding
This research was supported by the National Aeronautics and Space Administration under Cooperative Research Agreement NCC8-90, by the National Science Foundation under Grant CTS 94-19484, and by the Division of International Programs of the National Science Foundation. The calculations were performed on the SGI Power Challenge at the National Center for Supercomputing Applications at the University of Illinois at Urbana-Champaign under Grant CTS 96-0024N.
Funders | Funder number |
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National Science Foundation | CTS 94-19484 |
National Aeronautics and Space Administration | NCC8-90 |