Validation of a crystal plasticity model using high energy diffraction microscopy

A. J. Beaudoin; M. Obstalecki; R. Storer; W. Tayon; J. MacH; P. Kenesei; U. Lienert

doi:10.1088/0965-0393/20/2/024006

Validation of a crystal plasticity model using high energy diffraction microscopy

A. J. Beaudoin, M. Obstalecki, R. Storer, W. Tayon, J. MacH, P. Kenesei, U. Lienert

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23 Scopus citations

Abstract

High energy diffraction microscopy is used to measure the crystallographic orientation and evolution of lattice strain in an AlLi alloy. The relative spatial arrangement of the several pancake-shaped grains in a tensile sample is determined through in situ and ex situ techniques. A model for crystal plasticity with continuity of lattice spin is posed, where grains are represented by layers in a finite element mesh following the arrangement indicated by experiment. Comparison is drawn between experiment and simulation.

Original language	English
Article number	024006
Journal	Modelling and Simulation in Materials Science and Engineering
Volume	20
Issue number	2
DOIs	https://doi.org/10.1088/0965-0393/20/2/024006
State	Published - Mar 1 2012
Externally published	Yes

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10.1088/0965-0393/20/2/024006

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@article{dded1a1685ad4e26810ad04e771ec75b,

title = "Validation of a crystal plasticity model using high energy diffraction microscopy",

abstract = "High energy diffraction microscopy is used to measure the crystallographic orientation and evolution of lattice strain in an AlLi alloy. The relative spatial arrangement of the several pancake-shaped grains in a tensile sample is determined through in situ and ex situ techniques. A model for crystal plasticity with continuity of lattice spin is posed, where grains are represented by layers in a finite element mesh following the arrangement indicated by experiment. Comparison is drawn between experiment and simulation.",

author = "Beaudoin, \{A. J.\} and M. Obstalecki and R. Storer and W. Tayon and J. MacH and P. Kenesei and U. Lienert",

year = "2012",

month = mar,

day = "1",

doi = "10.1088/0965-0393/20/2/024006",

language = "English",

volume = "20",

journal = "Modelling and Simulation in Materials Science and Engineering",

issn = "0965-0393",

publisher = "IOP Publishing",

number = "2",

}

TY - JOUR

T1 - Validation of a crystal plasticity model using high energy diffraction microscopy

AU - Beaudoin, A. J.

AU - Obstalecki, M.

AU - Storer, R.

AU - Tayon, W.

AU - MacH, J.

AU - Kenesei, P.

AU - Lienert, U.

PY - 2012/3/1

Y1 - 2012/3/1

N2 - High energy diffraction microscopy is used to measure the crystallographic orientation and evolution of lattice strain in an AlLi alloy. The relative spatial arrangement of the several pancake-shaped grains in a tensile sample is determined through in situ and ex situ techniques. A model for crystal plasticity with continuity of lattice spin is posed, where grains are represented by layers in a finite element mesh following the arrangement indicated by experiment. Comparison is drawn between experiment and simulation.

AB - High energy diffraction microscopy is used to measure the crystallographic orientation and evolution of lattice strain in an AlLi alloy. The relative spatial arrangement of the several pancake-shaped grains in a tensile sample is determined through in situ and ex situ techniques. A model for crystal plasticity with continuity of lattice spin is posed, where grains are represented by layers in a finite element mesh following the arrangement indicated by experiment. Comparison is drawn between experiment and simulation.

UR - https://www.scopus.com/pages/publications/84857926741

U2 - 10.1088/0965-0393/20/2/024006

DO - 10.1088/0965-0393/20/2/024006

M3 - Article

AN - SCOPUS:84857926741

SN - 0965-0393

VL - 20

JO - Modelling and Simulation in Materials Science and Engineering

JF - Modelling and Simulation in Materials Science and Engineering

IS - 2

M1 - 024006

ER -

Validation of a crystal plasticity model using high energy diffraction microscopy

Abstract

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