Using temperature to tune film roughness: nonintuitive behavior in a simple system

C. R. Stoldt, K. J. Caspersen, M. C. Bartelt, C. J. Jenks, J. W. Evans, P. A. Thiel

Research output: Contribution to journalArticlepeer-review

65 Scopus citations

Abstract

An experimental study of the temperature dependence of multilayer homoepitaxy on Ag(100) between 300 and 50 K was carried out. Data were obtained from central portions of broad terraces in order to minimize the effect of step edges on data analysis. It was found that the Ag/Ag(100) exhibits the most complex variation of W vs T yet observed in any metal homoepitaxial system.

Original languageEnglish
Pages (from-to)800-803
Number of pages4
JournalPhysical Review Letters
Volume85
Issue number4
DOIs
StatePublished - Jul 24 2000
Externally publishedYes

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