Using Realistic Valence Electron Wave Functions in 4D-STEM Simulations

Mark P. Oxley; Wei Lou; M. Yoon; M. Chi

doi:10.1093/micmic/ozad067.366

Using Realistic Valence Electron Wave Functions in 4D-STEM Simulations

Mark P. Oxley, Wei Lou, M. Yoon, M. Chi

Oak Ridge National Laboratory

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	743-744
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	29
Issue number	1
DOIs	https://doi.org/10.1093/micmic/ozad067.366
State	Published - Jul 22 2023

Access to Document

10.1093/micmic/ozad067.366

Cite this

@article{bc834405360b4da2aa747028dca85e6b,

title = "Using Realistic Valence Electron Wave Functions in 4D-STEM Simulations",

author = "Oxley, {Mark P.} and Wei Lou and M. Yoon and M. Chi",

year = "2023",

month = jul,

day = "22",

doi = "10.1093/micmic/ozad067.366",

language = "English",

volume = "29",

pages = "743--744",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "1",

}

TY - JOUR

T1 - Using Realistic Valence Electron Wave Functions in 4D-STEM Simulations

AU - Oxley, Mark P.

AU - Lou, Wei

AU - Yoon, M.

AU - Chi, M.

PY - 2023/7/22

Y1 - 2023/7/22

UR - http://www.scopus.com/inward/record.url?scp=85168578765&partnerID=8YFLogxK

U2 - 10.1093/micmic/ozad067.366

DO - 10.1093/micmic/ozad067.366

M3 - Article

C2 - 37613452

AN - SCOPUS:85168578765

SN - 1431-9276

VL - 29

SP - 743

EP - 744

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 1

ER -

Using Realistic Valence Electron Wave Functions in 4D-STEM Simulations

Access to Document

Other files and links

Cite this