Using process models to optimize modulated tool-path chip breaking operations

William E. Barkman; Edwin F. Babelay; K. Scott Smith; Thomas S. Assaid; Justin T. McFarland; David A. Tursky

Using process models to optimize modulated tool-path chip breaking operations

William E. Barkman
, Edwin F. Babelay
, K. Scott Smith
, Thomas S. Assaid
, Justin T. McFarland
, David A. Tursky

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	Proceedings - ASPE 2010 Annual Meeting
Pages	25-28
Number of pages	4
State	Published - 2010
Externally published	Yes
Event	25th Annual Meeting of the American Society for Precision Engineering, ASPE 2010 - Atlanta, GA, United States Duration: Oct 31 2010 → Nov 4 2010

Publication series

Name	Proceedings - ASPE 2010 Annual Meeting
Volume	50

Conference

Conference	25th Annual Meeting of the American Society for Precision Engineering, ASPE 2010
Country/Territory	United States
City	Atlanta, GA
Period	10/31/10 → 11/4/10

Cite this

@inproceedings{018c7060443f4062888d0f9fe60511d6,

title = "Using process models to optimize modulated tool-path chip breaking operations",

author = "Barkman, \{William E.\} and Babelay, \{Edwin F.\} and Smith, \{K. Scott\} and Assaid, \{Thomas S.\} and McFarland, \{Justin T.\} and Tursky, \{David A.\}",

year = "2010",

language = "English",

isbn = "9781887706568",

series = "Proceedings - ASPE 2010 Annual Meeting",

pages = "25--28",

booktitle = "Proceedings - ASPE 2010 Annual Meeting",

note = "25th Annual Meeting of the American Society for Precision Engineering, ASPE 2010 ; Conference date: 31-10-2010 Through 04-11-2010",

}

Barkman, WE, Babelay, EF, Smith, KS, Assaid, TS, McFarland, JT & Tursky, DA 2010, Using process models to optimize modulated tool-path chip breaking operations. in Proceedings - ASPE 2010 Annual Meeting. Proceedings - ASPE 2010 Annual Meeting, vol. 50, pp. 25-28, 25th Annual Meeting of the American Society for Precision Engineering, ASPE 2010, Atlanta, GA, United States, 10/31/10.

TY - GEN

T1 - Using process models to optimize modulated tool-path chip breaking operations

AU - Barkman, William E.

AU - Babelay, Edwin F.

AU - Smith, K. Scott

AU - Assaid, Thomas S.

AU - McFarland, Justin T.

AU - Tursky, David A.

PY - 2010

Y1 - 2010

UR - https://www.scopus.com/pages/publications/84884405119

M3 - Conference contribution

AN - SCOPUS:84884405119

SN - 9781887706568

T3 - Proceedings - ASPE 2010 Annual Meeting

SP - 25

EP - 28

BT - Proceedings - ASPE 2010 Annual Meeting

T2 - 25th Annual Meeting of the American Society for Precision Engineering, ASPE 2010

Y2 - 31 October 2010 through 4 November 2010

ER -

Using process models to optimize modulated tool-path chip breaking operations

Publication series

Conference

Other files and links

Cite this