Using direct illumination CCDs as high-resolution area detectors for X-ray scattering

F. Livet; F. Bley; J. Mainville; R. Caudron; S. G.J. Mochrie; E. Geissler; G. Dolino; D. Abernathy; G. Grübel; M. Sutton

doi:10.1016/S0168-9002(00)00333-8

Using direct illumination CCDs as high-resolution area detectors for X-ray scattering

F. Livet, F. Bley, J. Mainville, R. Caudron, S. G.J. Mochrie, E. Geissler, G. Dolino, D. Abernathy, G. Grübel, M. Sutton

Research output: Contribution to journal › Article › peer-review

84 Scopus citations

Abstract

The use of charge-coupled devices (CCDs) under direct illumination of X-rays for two-dimensional position-sensitive detectors in high-resolution diffraction experiments is discussed. Two detectors are compared: a standard CCD and a `deep depletion' CCD. These give position resolution close to the pixel size (approximately 22μm), and energy resolution close to the theoretical resolution of a Si detector. These detectors can be used for photon-counting and an algorithm for electronic noise suppression is presented. This algorithm is useful for experiments with frequent readouts and low intensity. Examples demonstrating the advantages of this algorithm for diffraction experiments are given.

Original language	English
Pages (from-to)	596-609
Number of pages	14
Journal	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	451
Issue number	3
DOIs	https://doi.org/10.1016/S0168-9002(00)00333-8
State	Published - Sep 11 2000
Externally published	Yes

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Livet, F., Bley, F., Mainville, J., Caudron, R., Mochrie, S. G. J., Geissler, E., Dolino, G., Abernathy, D., Grübel, G., & Sutton, M. (2000). Using direct illumination CCDs as high-resolution area detectors for X-ray scattering. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 451(3), 596-609. https://doi.org/10.1016/S0168-9002(00)00333-8

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title = "Using direct illumination CCDs as high-resolution area detectors for X-ray scattering",

abstract = "The use of charge-coupled devices (CCDs) under direct illumination of X-rays for two-dimensional position-sensitive detectors in high-resolution diffraction experiments is discussed. Two detectors are compared: a standard CCD and a `deep depletion' CCD. These give position resolution close to the pixel size (approximately 22μm), and energy resolution close to the theoretical resolution of a Si detector. These detectors can be used for photon-counting and an algorithm for electronic noise suppression is presented. This algorithm is useful for experiments with frequent readouts and low intensity. Examples demonstrating the advantages of this algorithm for diffraction experiments are given.",

author = "F. Livet and F. Bley and J. Mainville and R. Caudron and Mochrie, {S. G.J.} and E. Geissler and G. Dolino and D. Abernathy and G. Gr{\"u}bel and M. Sutton",

year = "2000",

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doi = "10.1016/S0168-9002(00)00333-8",

language = "English",

volume = "451",

pages = "596--609",

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Livet, F, Bley, F, Mainville, J, Caudron, R, Mochrie, SGJ, Geissler, E, Dolino, G, Abernathy, D, Grübel, G & Sutton, M 2000, 'Using direct illumination CCDs as high-resolution area detectors for X-ray scattering', Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 451, no. 3, pp. 596-609. https://doi.org/10.1016/S0168-9002(00)00333-8

Using direct illumination CCDs as high-resolution area detectors for X-ray scattering. / Livet, F.; Bley, F.; Mainville, J. et al.
In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 451, No. 3, 11.09.2000, p. 596-609.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Using direct illumination CCDs as high-resolution area detectors for X-ray scattering

AU - Livet, F.

AU - Bley, F.

AU - Mainville, J.

AU - Caudron, R.

AU - Mochrie, S. G.J.

AU - Geissler, E.

AU - Dolino, G.

AU - Abernathy, D.

AU - Grübel, G.

AU - Sutton, M.

PY - 2000/9/11

Y1 - 2000/9/11

N2 - The use of charge-coupled devices (CCDs) under direct illumination of X-rays for two-dimensional position-sensitive detectors in high-resolution diffraction experiments is discussed. Two detectors are compared: a standard CCD and a `deep depletion' CCD. These give position resolution close to the pixel size (approximately 22μm), and energy resolution close to the theoretical resolution of a Si detector. These detectors can be used for photon-counting and an algorithm for electronic noise suppression is presented. This algorithm is useful for experiments with frequent readouts and low intensity. Examples demonstrating the advantages of this algorithm for diffraction experiments are given.

AB - The use of charge-coupled devices (CCDs) under direct illumination of X-rays for two-dimensional position-sensitive detectors in high-resolution diffraction experiments is discussed. Two detectors are compared: a standard CCD and a `deep depletion' CCD. These give position resolution close to the pixel size (approximately 22μm), and energy resolution close to the theoretical resolution of a Si detector. These detectors can be used for photon-counting and an algorithm for electronic noise suppression is presented. This algorithm is useful for experiments with frequent readouts and low intensity. Examples demonstrating the advantages of this algorithm for diffraction experiments are given.

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SN - 0168-9002

VL - 451

SP - 596

EP - 609

JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

IS - 3

ER -

Using direct illumination CCDs as high-resolution area detectors for X-ray scattering

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