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Untangling Coupled Order Parameters at Complex Oxide Interfaces with Aberration-Corrected STEM and EELS

  • A. Y. Borisevich
  • , Y. M. Kim
  • , M. P. Oxley
  • , A. Morozovska
  • , E. Eliseev
  • , Y. H. Chu
  • , P. Yu
  • , S. J. Pennycook
  • , S. V. Kalinin

Research output: Contribution to journalArticlepeer-review

1 Scopus citations
Original languageEnglish
Pages (from-to)318-319
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
DOIs
StatePublished - Jul 2012

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