Original language | English |
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Pages (from-to) | 318-319 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 18 |
DOIs | |
State | Published - Jul 2012 |
Untangling Coupled Order Parameters at Complex Oxide Interfaces with Aberration-Corrected STEM and EELS
A. Y. Borisevich, Y. M. Kim, M. P. Oxley, A. Morozovska, E. Eliseev, Y. H. Chu, P. Yu, S. J. Pennycook, S. V. Kalinin
Research output: Contribution to journal › Article › peer-review
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