Unit cell orientation of tetragonal-like BiFeO3 thin films grown on highly miscut LaAlO3 substrates

C. Beekman; W. Siemons; T. Z. Ward; J. D. Budai; J. Z. Tischler; R. Xu; W. Liu; N. Balke; J. H. Nam; H. M. Christen

doi:10.1063/1.4809601

Unit cell orientation of tetragonal-like BiFeO₃ thin films grown on highly miscut LaAlO₃ substrates

C. Beekman, W. Siemons, T. Z. Ward, J. D. Budai, J. Z. Tischler, R. Xu, W. Liu, N. Balke, J. H. Nam, H. M. Christen

Quantum Heterostructures

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Abstract

Synchrotron and lab-scale x-ray diffraction shows that tetragonal-like T′-BiFeO₃ films on miscut LaAlO₃ substrates (α < 5°) exhibit (00l)-planes tilted away from those of the substrate as predicted by the "Nagai model" (except for miscut < 0.2°). Tilts as large as 1° are achieved even in 100 nm thick films, strikingly larger than those observed in other perovskites. We attribute this to the large c/a ratio and the high crystalline coherency of the T′-BiFeO ₃/LaAlO₃ interface. This coherency is possible through an observed "diagonal-on-diagonal" film/substrate alignment. Interestingly, the substrate miscut does not influence the relative population of monoclinic domains.

Original language	English
Article number	221910
Journal	Applied Physics Letters
Volume	102
Issue number	22
DOIs	https://doi.org/10.1063/1.4809601
State	Published - Jun 3 2013

Funding

Research supported by the U. S. Department of Energy (DOE), Basic Energy Sciences (BES), Materials Science and Engineering Division (H.M.C., J.D.B., W.S., C.B., T.W.Z., and J.H.N.). Piezoresponse force microscopy (N.B.) was conducted at the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, and x-ray microdiffraction (J.Z.T., R.X., W.L.) at the Advanced Photon Source, Argonne National Laboratory, both supported by the Scientific User Facilities Division of DOE-BES.

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title = "Unit cell orientation of tetragonal-like BiFeO3 thin films grown on highly miscut LaAlO3 substrates",

abstract = "Synchrotron and lab-scale x-ray diffraction shows that tetragonal-like T′-BiFeO3 films on miscut LaAlO3 substrates (α < 5°) exhibit (00l)-planes tilted away from those of the substrate as predicted by the {"}Nagai model{"} (except for miscut < 0.2°). Tilts as large as 1° are achieved even in 100 nm thick films, strikingly larger than those observed in other perovskites. We attribute this to the large c/a ratio and the high crystalline coherency of the T′-BiFeO 3/LaAlO3 interface. This coherency is possible through an observed {"}diagonal-on-diagonal{"} film/substrate alignment. Interestingly, the substrate miscut does not influence the relative population of monoclinic domains.",

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T1 - Unit cell orientation of tetragonal-like BiFeO3 thin films grown on highly miscut LaAlO3 substrates

AU - Beekman, C.

AU - Siemons, W.

AU - Ward, T. Z.

AU - Budai, J. D.

AU - Tischler, J. Z.

AU - Xu, R.

AU - Liu, W.

AU - Balke, N.

AU - Nam, J. H.

AU - Christen, H. M.

PY - 2013/6/3

Y1 - 2013/6/3

N2 - Synchrotron and lab-scale x-ray diffraction shows that tetragonal-like T′-BiFeO3 films on miscut LaAlO3 substrates (α < 5°) exhibit (00l)-planes tilted away from those of the substrate as predicted by the "Nagai model" (except for miscut < 0.2°). Tilts as large as 1° are achieved even in 100 nm thick films, strikingly larger than those observed in other perovskites. We attribute this to the large c/a ratio and the high crystalline coherency of the T′-BiFeO 3/LaAlO3 interface. This coherency is possible through an observed "diagonal-on-diagonal" film/substrate alignment. Interestingly, the substrate miscut does not influence the relative population of monoclinic domains.

AB - Synchrotron and lab-scale x-ray diffraction shows that tetragonal-like T′-BiFeO3 films on miscut LaAlO3 substrates (α < 5°) exhibit (00l)-planes tilted away from those of the substrate as predicted by the "Nagai model" (except for miscut < 0.2°). Tilts as large as 1° are achieved even in 100 nm thick films, strikingly larger than those observed in other perovskites. We attribute this to the large c/a ratio and the high crystalline coherency of the T′-BiFeO 3/LaAlO3 interface. This coherency is possible through an observed "diagonal-on-diagonal" film/substrate alignment. Interestingly, the substrate miscut does not influence the relative population of monoclinic domains.

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Unit cell orientation of tetragonal-like BiFeO₃ thin films grown on highly miscut LaAlO₃ substrates

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