Understanding individual defects in CdTe thin-film solar cells via STEM: From atomic structure to electrical activity

Chen Li, Jonathan Poplawsky, Yanfa Yan, Stephen J. Pennycook

Research output: Contribution to journalReview articlepeer-review

37 Scopus citations

Abstract

Here we review a systematic study of the structure-property correlations of a series of defects in CdTe solar cells. A variety of experimental methods, including aberration-corrected scanning transmission electron microscopy, electron energy loss spectroscopy, energy dispersive X-ray spectroscopy, and electron-beam-induced current have been combined with density-functional theory. The research traces the connections between the structures and electrical activities of individual defects including intra-grain partial dislocations, grain boundaries and the CdTe/CdS interface. The interpretations of the physical origin underlying the structure-property correlation provide insights that should further the development of future CdTe solar cells.

Original languageEnglish
Pages (from-to)64-76
Number of pages13
JournalMaterials Science in Semiconductor Processing
Volume65
DOIs
StatePublished - Jul 2017

Funding

This manuscript has been authored by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy. The United States Government retains and the publisher, by accepting the article for publication, acknowledges that the United States Government retains a non-exclusive, paid-up, irrevocable, world-wide license to publish or reproduce the published form of this manuscript, or allow others to do so, for United States Government purposes. The Department of Energy will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan ( http://energy.gov/downloads/doe-public-access-plan ). This research was sponsored by the US Department of Energy (DOE) , Office of Energy Efficiency and Renewable Energy , Foundational Program to Advance Cell Efficiency (F-PACE, DE-FOA-0000492 ), and the Office of Basic Energy Sciences, and Materials Science and Engineering Division, at Oak Ridge National Laboratory (ORNL) . J.P. was supported in part by ORNL's laboratory directed research and development (LDRD) program. APT, SEM-EBIC, and EBSD measurements were conducted at ORNL's Center for Nanophase Materials Sciences (CNMS), which is a U.S. DOE Office of Science User Facility. STEM-EDX research was supported by the UK National Facility for Aberration-Corrected STEM. Computational facilities were provided by the National Energy Research Scientific Computing Center.

FundersFunder number
U.S. Department of Energy
Office of Energy Efficiency and Renewable EnergyDE-FOA-0000492
Basic Energy Sciences
Oak Ridge National Laboratory
Laboratory Directed Research and Development
Horizon 2020 Framework Programme656378

    Keywords

    • CdTe solar cells
    • Dislocation
    • Grain boundary
    • Interface
    • Scanning transmission electron microscopy

    Fingerprint

    Dive into the research topics of 'Understanding individual defects in CdTe thin-film solar cells via STEM: From atomic structure to electrical activity'. Together they form a unique fingerprint.

    Cite this