| Original language | English |
|---|---|
| Pages (from-to) | 269-270 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 30 |
| Issue number | 2024 |
| DOIs | |
| State | Published - Jul 24 2024 |
| Event | 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024 |
Funding
Atomic-resolution STEM imaging and 4D-STEM portions of this research was supported by the Center for Nanophase Materials Sciences (CNMS), which is a US Department of Energy, Office of Science User Facility at Oak Ridge National Laboratory. This abstract has been authored by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy. The Department of Energy will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan (http://energy.gov/downloads/doe-public-access-plan)