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Understanding and removing FIB artifacts in metallic TEM samples using flash electropolishing
Danny J. Edwards, Alan Schemer-Kohrn, Matt Olszta, Ramprashad Prabhakaran, Yuanyuan Zhu, Jing Wang, Jacob Haag, Osman El Atwani, Timothy G. Lach, Mychailo Toloczko
Research output: Contribution to journal › Article › peer-review