Understanding and removing FIB artifacts in metallic TEM samples using flash electropolishing

  • Danny J. Edwards
  • , Alan Schemer-Kohrn
  • , Matt Olszta
  • , Ramprashad Prabhakaran
  • , Yuanyuan Zhu
  • , Jing Wang
  • , Jacob Haag
  • , Osman El Atwani
  • , Timothy G. Lach
  • , Mychailo Toloczko

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

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Material Science