ULTRATRACE SOLIDS ANALYSES USING RESONANCE IONIZATION SPECTROSCOPY.

J. E. Parks; L. J. Moore; M. T. Spaar; D. W. Beekman; E. H. Taylor

ULTRATRACE SOLIDS ANALYSES USING RESONANCE IONIZATION SPECTROSCOPY.

J. E. Parks
, L. J. Moore
, M. T. Spaar
, D. W. Beekman
, E. H. Taylor

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Sputter initiated resonance ionization spectroscopy (SIRIS) is a new, ultrasensitive analytical technique for solids analysis, particularly in the fields of semiconductors, geophysics, biology, medicine, health physics, and basic science. SIRIS is described with results of semiconductor and biological applications.

Original language	English
Title of host publication	Unknown Host Publication Title
Publisher	Optical Soc of America
Pages	80
Number of pages	1
ISBN (Print)	0936659386
State	Published - 1987
Externally published	Yes

Cite this

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title = "ULTRATRACE SOLIDS ANALYSES USING RESONANCE IONIZATION SPECTROSCOPY.",

abstract = "Sputter initiated resonance ionization spectroscopy (SIRIS) is a new, ultrasensitive analytical technique for solids analysis, particularly in the fields of semiconductors, geophysics, biology, medicine, health physics, and basic science. SIRIS is described with results of semiconductor and biological applications.",

author = "Parks, \{J. E.\} and Moore, \{L. J.\} and Spaar, \{M. T.\} and Beekman, \{D. W.\} and Taylor, \{E. H.\}",

year = "1987",

language = "English",

isbn = "0936659386",

publisher = "Optical Soc of America",

pages = "80",

booktitle = "Unknown Host Publication Title",

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T1 - ULTRATRACE SOLIDS ANALYSES USING RESONANCE IONIZATION SPECTROSCOPY.

AU - Parks, J. E.

AU - Moore, L. J.

AU - Spaar, M. T.

AU - Beekman, D. W.

AU - Taylor, E. H.

PY - 1987

Y1 - 1987

N2 - Sputter initiated resonance ionization spectroscopy (SIRIS) is a new, ultrasensitive analytical technique for solids analysis, particularly in the fields of semiconductors, geophysics, biology, medicine, health physics, and basic science. SIRIS is described with results of semiconductor and biological applications.

AB - Sputter initiated resonance ionization spectroscopy (SIRIS) is a new, ultrasensitive analytical technique for solids analysis, particularly in the fields of semiconductors, geophysics, biology, medicine, health physics, and basic science. SIRIS is described with results of semiconductor and biological applications.

UR - https://www.scopus.com/pages/publications/0023603766

M3 - Conference contribution

AN - SCOPUS:0023603766

SN - 0936659386

SP - 80

BT - Unknown Host Publication Title

PB - Optical Soc of America

ER -

ULTRATRACE SOLIDS ANALYSES USING RESONANCE IONIZATION SPECTROSCOPY.

Abstract

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