ULTRATRACE SOLIDS ANALYSES USING RESONANCE IONIZATION SPECTROSCOPY.

J. E. Parks, L. J. Moore, M. T. Spaar, D. W. Beekman, E. H. Taylor

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Sputter initiated resonance ionization spectroscopy (SIRIS) is a new, ultrasensitive analytical technique for solids analysis, particularly in the fields of semiconductors, geophysics, biology, medicine, health physics, and basic science. SIRIS is described with results of semiconductor and biological applications.

Original languageEnglish
Title of host publicationUnknown Host Publication Title
PublisherOptical Soc of America
Pages80
Number of pages1
ISBN (Print)0936659386
StatePublished - 1987
Externally publishedYes

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