Abstract
Sputter initiated resonance ionization spectroscopy (SIRIS) is a new, ultrasensitive analytical technique for solids analysis, particularly in the fields of semiconductors, geophysics, biology, medicine, health physics, and basic science. SIRIS is described with results of semiconductor and biological applications.
Original language | English |
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Title of host publication | Unknown Host Publication Title |
Publisher | Optical Soc of America |
Pages | 80 |
Number of pages | 1 |
ISBN (Print) | 0936659386 |
State | Published - 1987 |
Externally published | Yes |