| Original language | English |
|---|---|
| Pages (from-to) | 1388-1389 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 14 |
| Issue number | SUPPL. 2 |
| DOIs | |
| State | Published - Aug 2008 |
Ultrastructure of a metal/superconductor interface revealed by atomic-resolution STEM techniques
- Y. Xin
- , L. F. Allard
- , Z. Q. Mao
Research output: Contribution to journal › Article › peer-review