Original language | English |
---|---|
Pages (from-to) | 1388-1389 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 14 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - Aug 2008 |
Ultrastructure of a metal/superconductor interface revealed by atomic-resolution STEM techniques
Y. Xin, L. F. Allard, Z. Q. Mao
Research output: Contribution to journal › Article › peer-review