Ultrastructure of a metal/superconductor interface revealed by atomic-resolution STEM techniques

Y. Xin, L. F. Allard, Z. Q. Mao

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)1388-1389
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 2008

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