Ultrasensitive measurement of MEMS cantilever displacement below the photon shot noise limit

B. J. Lawrie; R. C. Pooser

Ultrasensitive measurement of MEMS cantilever displacement below the photon shot noise limit

Quantum Heterostructures

Research output: Contribution to conference › Paper › peer-review

Abstract

We demonstrate sub-shot-noise microcantilever displacement sensitivity using simple differential measurements with multi-spatial-mode squeezed light, a result that may be critical for ultra-trace sensing and imaging applications.

Original language	English
State	Published - 2014
Event	2014 Conference on Lasers and Electro-Optics, CLEO 2014 - San Jose, United States Duration: Jun 8 2014 → Jun 13 2014

Conference

Conference	2014 Conference on Lasers and Electro-Optics, CLEO 2014
Country/Territory	United States
City	San Jose
Period	06/8/14 → 06/13/14

Cite this

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title = "Ultrasensitive measurement of MEMS cantilever displacement below the photon shot noise limit",

abstract = "We demonstrate sub-shot-noise microcantilever displacement sensitivity using simple differential measurements with multi-spatial-mode squeezed light, a result that may be critical for ultra-trace sensing and imaging applications.",

author = "Lawrie, {B. J.} and Pooser, {R. C.}",

note = "Publisher Copyright: {\textcopyright} 2014 Optical Society of America.; 2014 Conference on Lasers and Electro-Optics, CLEO 2014 ; Conference date: 08-06-2014 Through 13-06-2014",

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language = "English",

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TY - CONF

T1 - Ultrasensitive measurement of MEMS cantilever displacement below the photon shot noise limit

AU - Lawrie, B. J.

AU - Pooser, R. C.

PY - 2014

Y1 - 2014

N2 - We demonstrate sub-shot-noise microcantilever displacement sensitivity using simple differential measurements with multi-spatial-mode squeezed light, a result that may be critical for ultra-trace sensing and imaging applications.

AB - We demonstrate sub-shot-noise microcantilever displacement sensitivity using simple differential measurements with multi-spatial-mode squeezed light, a result that may be critical for ultra-trace sensing and imaging applications.

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M3 - Paper

AN - SCOPUS:84944706008

T2 - 2014 Conference on Lasers and Electro-Optics, CLEO 2014

Y2 - 8 June 2014 through 13 June 2014

ER -

Ultrasensitive measurement of MEMS cantilever displacement below the photon shot noise limit

Abstract

Conference

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