ULTRASENSITIVE ELEMENTAL ANALYSIS OF MATERIALS USING SPUTTER INITIATED RESONANCE IONIZATION SPECTROSCOPY.

J. E. Parks; D. W. Beekman; H. W. Schmitt; M. T. Spaar

doi:10.1557/proc-48-309

ULTRASENSITIVE ELEMENTAL ANALYSIS OF MATERIALS USING SPUTTER INITIATED RESONANCE IONIZATION SPECTROSCOPY.

J. E. Parks, D. W. Beekman, H. W. Schmitt, M. T. Spaar

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

5 Scopus citations

Original language	English
Title of host publication	Materials Research Society Symposia Proceedings
Publisher	Materials Research Soc
Pages	309-317
Number of pages	9
ISBN (Print)	0931837138, 9780931837135
DOIs	https://doi.org/10.1557/proc-48-309
State	Published - 1985
Externally published	Yes

Publication series

Name	Materials Research Society Symposia Proceedings
Volume	48
ISSN (Print)	0272-9172

Access to Document

10.1557/proc-48-309

Cite this

@inproceedings{006682e97edf453597a2dedbde735ddb,

title = "ULTRASENSITIVE ELEMENTAL ANALYSIS OF MATERIALS USING SPUTTER INITIATED RESONANCE IONIZATION SPECTROSCOPY.",

author = "Parks, {J. E.} and Beekman, {D. W.} and Schmitt, {H. W.} and Spaar, {M. T.}",

year = "1985",

doi = "10.1557/proc-48-309",

language = "English",

isbn = "0931837138",

series = "Materials Research Society Symposia Proceedings",

publisher = "Materials Research Soc",

pages = "309--317",

booktitle = "Materials Research Society Symposia Proceedings",

}

ULTRASENSITIVE ELEMENTAL ANALYSIS OF MATERIALS USING SPUTTER INITIATED RESONANCE IONIZATION SPECTROSCOPY. / Parks, J. E.; Beekman, D. W.; Schmitt, H. W. et al.
Materials Research Society Symposia Proceedings. Materials Research Soc, 1985. p. 309-317 (Materials Research Society Symposia Proceedings; Vol. 48).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - ULTRASENSITIVE ELEMENTAL ANALYSIS OF MATERIALS USING SPUTTER INITIATED RESONANCE IONIZATION SPECTROSCOPY.

AU - Parks, J. E.

AU - Beekman, D. W.

AU - Schmitt, H. W.

AU - Spaar, M. T.

PY - 1985

Y1 - 1985

UR - http://www.scopus.com/inward/record.url?scp=0022223847&partnerID=8YFLogxK

U2 - 10.1557/proc-48-309

DO - 10.1557/proc-48-309

M3 - Conference contribution

AN - SCOPUS:0022223847

SN - 0931837138

SN - 9780931837135

T3 - Materials Research Society Symposia Proceedings

SP - 309

EP - 317

BT - Materials Research Society Symposia Proceedings

PB - Materials Research Soc

ER -

ULTRASENSITIVE ELEMENTAL ANALYSIS OF MATERIALS USING SPUTTER INITIATED RESONANCE IONIZATION SPECTROSCOPY.

Publication series

Access to Document

Other files and links

Cite this