Ultra-high mobility transparent organic thin film transistors grown by an off-centre spin-coating method

Yongbo Yuan, Gaurav Giri, Alexander L. Ayzner, Arjan P. Zoombelt, Stefan C.B. Mannsfeld, Jihua Chen, Dennis Nordlund, Michael F. Toney, Jinsong Huang, Zhenan Bao

Research output: Contribution to journalArticlepeer-review

1216 Scopus citations

Abstract

Organic semiconductors with higher carrier mobility and better transparency have been actively pursued for numerous applications, such as flat-panel display backplane and sensor arrays. The carrier mobility is an important figure of merit and is sensitively influenced by the crystallinity and the molecular arrangement in a crystal lattice. Here we describe the growth of a highly aligned meta-stable structure of 2,7-dioctyl[1]benzothieno[3,2-b][1]benzothiophene (C8-BTBT) from a blended solution of C8-BTBT and polystyrene by using a novel off-centre spin-coating method. Combined with a vertical phase separation of the blend, the highly aligned, meta-stable C8-BTBT films provide a significantly increased thin film transistor hole mobility up to 43cm2 Vs-1 (25cm2 Vs-1 on average), which is the highest value reported to date for all organic molecules. The resulting transistors show high transparency of >90% over the visible spectrum, indicating their potential for transparent, high-performance organic electronics.

Original languageEnglish
Article number3005
JournalNature Communications
Volume5
DOIs
StatePublished - Jan 8 2014

Funding

This work was financially supported by Defense Advanced Research Projects Agency under the award W31P4Q-08-C-0439 through Agiltron Inc. and the National Science Foundation (DMR-1303178, ECCS-1348272 and CMMI-1265834) and Air Force Office of Scientific Research (FA9550-12-1-0190). The HRTEM was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, US Department of Energy. Portions of this research were carried out at the Stanford Synchrotron Radiation Lightsource, a national user facility operated by Stanford University on behalf of the US Department of Energy, Office of Basic Energy Sciences. We thank Dr Hylke B. Akkerman and Dr Gerwin H. Gelinck in Holst Centre for the verification of the transfer curves.

FundersFunder number
Agiltron Inc.
National Science FoundationECCS-1348272, DMR-1303178, 1303178, CMMI-1265834
Air Force Office of Scientific ResearchFA9550-12-1-0190
Defense Advanced Research Projects AgencyW31P4Q-08-C-0439

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