Ultimate resolution limit for Z-contrast STEM: Atoms are smaller in ADF

Y. Peng; M. P. Oxley; A. R. Lupini; M. F. Chisholm; S. J. Pennycook

doi:10.1017/S1431927606067572

Ultimate resolution limit for Z-contrast STEM: Atoms are smaller in ADF

Y. Peng, M. P. Oxley, A. R. Lupini, M. F. Chisholm, S. J. Pennycook

electron Microscopy and Microanalysis

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1340-1341
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606067572
State	Published - Aug 2006

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title = "Ultimate resolution limit for Z-contrast STEM: Atoms are smaller in ADF",

author = "Y. Peng and Oxley, \{M. P.\} and Lupini, \{A. R.\} and Chisholm, \{M. F.\} and Pennycook, \{S. J.\}",

year = "2006",

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language = "English",

volume = "12",

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T1 - Ultimate resolution limit for Z-contrast STEM

T2 - Atoms are smaller in ADF

AU - Peng, Y.

AU - Oxley, M. P.

AU - Lupini, A. R.

AU - Chisholm, M. F.

AU - Pennycook, S. J.

PY - 2006/8

Y1 - 2006/8

UR - https://www.scopus.com/pages/publications/33750883416

U2 - 10.1017/S1431927606067572

DO - 10.1017/S1431927606067572

M3 - Article

AN - SCOPUS:33750883416

SN - 1431-9276

VL - 12

SP - 1340

EP - 1341

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Ultimate resolution limit for Z-contrast STEM: Atoms are smaller in ADF

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