Ultimate resolution limit for Z-contrast STEM: Atoms are smaller in ADF

Y. Peng; M. P. Oxley; A. R. Lupini; M. F. Chisholm; S. J. Pennycook

doi:10.1017/S1431927606067572

Ultimate resolution limit for Z-contrast STEM: Atoms are smaller in ADF

Y. Peng, M. P. Oxley, A. R. Lupini, M. F. Chisholm, S. J. Pennycook

electron Microscopy and Microanalysis

Oak Ridge National Laboratory

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1340-1341
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606067572
State	Published - Aug 2006

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title = "Ultimate resolution limit for Z-contrast STEM: Atoms are smaller in ADF",

author = "Y. Peng and Oxley, {M. P.} and Lupini, {A. R.} and Chisholm, {M. F.} and Pennycook, {S. J.}",

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AU - Lupini, A. R.

AU - Chisholm, M. F.

AU - Pennycook, S. J.

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JO - Microscopy and Microanalysis

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Ultimate resolution limit for Z-contrast STEM: Atoms are smaller in ADF

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