Abstract
We have investigated intentionally undoped p-type ZnO films grown on Si(111) substrates by pulsed-laser deposition as a function of the oxygen pressure. It is shown that the undoped ZnO films experience type conversion from n-type to p-type when the oxygen pressure changes from 7.98×10 -3 to 3.99×10-2 Pa. Ti/Au contacts give ohmic behaviour to n-type ZnO (∼1017 cm-3), but leaky Schottky behaviour to p-type ZnO (∼1018 cm-3). It is argued based on PL results that native defects, such as oxygen and zinc vacancies, could play an important role in determining the conductivity of these nominally undoped ZnO films.
| Original language | English |
|---|---|
| Pages (from-to) | 130-137 |
| Number of pages | 8 |
| Journal | Superlattices and Microstructures |
| Volume | 39 |
| Issue number | 1-4 |
| DOIs | |
| State | Published - Jan 2006 |
| Externally published | Yes |
| Event | E-MRS 2005 Symposium G: ZnO and Related Materials Part 2 - Duration: May 31 2005 → Jun 3 2005 |
Funding
This work was in part supported by the US Air Force Office of Scientific Research (AFOSR)/Asian Office of Aerospace Research & Development (AOARD).