Abstract
We have investigated intentionally undoped p-type ZnO films grown on Si(111) substrates by pulsed-laser deposition as a function of the oxygen pressure. It is shown that the undoped ZnO films experience type conversion from n-type to p-type when the oxygen pressure changes from 7.98×10 -3 to 3.99×10-2 Pa. Ti/Au contacts give ohmic behaviour to n-type ZnO (∼1017 cm-3), but leaky Schottky behaviour to p-type ZnO (∼1018 cm-3). It is argued based on PL results that native defects, such as oxygen and zinc vacancies, could play an important role in determining the conductivity of these nominally undoped ZnO films.
Original language | English |
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Pages (from-to) | 130-137 |
Number of pages | 8 |
Journal | Superlattices and Microstructures |
Volume | 39 |
Issue number | 1-4 |
DOIs | |
State | Published - Jan 2006 |
Externally published | Yes |
Event | E-MRS 2005 Symposium G: ZnO and Related Materials Part 2 - Duration: May 31 2005 → Jun 3 2005 |
Funding
This work was in part supported by the US Air Force Office of Scientific Research (AFOSR)/Asian Office of Aerospace Research & Development (AOARD).
Funders | Funder number |
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AOARD | |
Asian Office of Aerospace Research & Development | |
Air Force Office of Scientific Research |