Two-dimensional pattern reverse Monte Carlo method for modelling the structures of nano-particles in uniaxial elongated rubbers

  • K. Hagita
  • , T. Arai
  • , H. Kishimoto
  • , N. Umesaki
  • , Y. Shinohara
  • , Y. Amemiya

Research output: Contribution to journalArticlepeer-review

24 Scopus citations

Abstract

Two-dimensional pattern reverse Monte Carlo (2D pattern RMC) analysis is performed to model the structures of nano-particles in uniaxially elongated rubbers using two-dimensional patterns of structure factor of the nano-particles obtained by time-resolved two-dimensional ultra-small angle x-ray scattering. Four spot patterns are observed for a large elongation ratio and the shapes change with increasing elongation ratio. We performed the 2D pattern RMC method for the uniaxial system in order to make a model of the structures from the two-dimensional structure factors. The preliminary results of the 2D pattern RMC analysis of the two-dimensional structure factors of silica particles in a uniaxially elongated styrene-butadiene rubber are presented.

Original languageEnglish
Article number335217
JournalJournal of Physics Condensed Matter
Volume19
Issue number33
DOIs
StatePublished - Aug 22 2007
Externally publishedYes

Fingerprint

Dive into the research topics of 'Two-dimensional pattern reverse Monte Carlo method for modelling the structures of nano-particles in uniaxial elongated rubbers'. Together they form a unique fingerprint.

Cite this