Abstract
We show that relative beam displacement measurements with two-mode squeezed light sources are identical to truncated SU(1,1) interferometers, enabling a new quantum-enhanced atomic force microscopy suitable for broadband characterization of high-speed dynamics in materials.
| Original language | English |
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| Title of host publication | 2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9781943580576 |
| DOIs | |
| State | Published - May 2019 |
| Event | 2019 Conference on Lasers and Electro-Optics, CLEO 2019 - San Jose, United States Duration: May 5 2019 → May 10 2019 |
Publication series
| Name | 2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings |
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Conference
| Conference | 2019 Conference on Lasers and Electro-Optics, CLEO 2019 |
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| Country/Territory | United States |
| City | San Jose |
| Period | 05/5/19 → 05/10/19 |
Funding
This work was performed at Oak Ridge National Laboratory, operated by UT-Battelle for the U.S. Department of Energy under contract no. DE-AC05-00OR22725, and was sponsored by the Laboratory-Directed Research and Development Program of Oak Ridge National Laboratory, managed by UT-Battelle, LLC for the U.S. Department of Energy, and the U.S. Department of Energy, Office of Science, Office of Workforce Development for Teachers and Scientists (WDTS) under the Science Undergraduate Laboratory Internship program.