Transport properties and infrared spectra of CuCl thin films

Madhavi Z. Martin, David K. Shuh, R. Stanley Williams, Robert M. Ostrom

Research output: Contribution to journalArticlepeer-review

Abstract

The current-voltage (I-V) characteristics, dc conductivity, and infrared spectra of cuprous chloride (CuCl) thin films of different thicknesses have been experimentally investigated. The absorption peak energy in the infrared spectra and the activation energy obtained from resistivity measurements were found to be the same. This may be attributed to the existence of an indirect gap E ΓX =0.41 eV. It was also observed that as the thickness of the samples decreased the absorption peaks shifted toward higher energies. This is thought to be due to the creation of strain within the lattice when the samples are prepared by molecular-beam epitaxy and has been explained on the basis of quantum size effects.

Original languageEnglish
Pages (from-to)3097-3101
Number of pages5
JournalJournal of Applied Physics
Volume67
Issue number6
DOIs
StatePublished - 1990
Externally publishedYes

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