Abstract
The two-modulator generalized ellipsometer has been used to measure samples in transmission. In this configuration, the instrument can completely characterize a linear diattenuator and retarder, measuring birefringence, diattenuation, the angle of the principal axis, and the sample depolarization simultaneously and accurately. This instrument can be operated in two modes: (1) spectroscopic, in which measurements are made through the entire sample aperture as a function of wavelength, and (2) spatially resolved, in which measurements are made at a single wavelength and a birefringence picture is made of the sample. Current spatially resolved measurements have been made at a resolution of 40 #x03BC;m. Four samples have been examined with this instrument: (1) a mica plate, (2) a Polaroid polarizer, and (3) two quartz plates.
| Original language | English |
|---|---|
| Pages (from-to) | 6555-6566 |
| Number of pages | 12 |
| Journal | Applied Optics |
| Volume | 41 |
| Issue number | 31 |
| DOIs | |
| State | Published - Nov 1 2002 |
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