TY - JOUR
T1 - Transmission two-modulator generalized ellipsometry measurements
AU - Jellison, Gerald E.
AU - Griffiths, C. Owen
AU - Holcomb, David E.
AU - Rouleau, Christopher M.
PY - 2002/11/1
Y1 - 2002/11/1
N2 - The two-modulator generalized ellipsometer has been used to measure samples in transmission. In this configuration, the instrument can completely characterize a linear diattenuator and retarder, measuring birefringence, diattenuation, the angle of the principal axis, and the sample depolarization simultaneously and accurately. This instrument can be operated in two modes: (1) spectroscopic, in which measurements are made through the entire sample aperture as a function of wavelength, and (2) spatially resolved, in which measurements are made at a single wavelength and a birefringence picture is made of the sample. Current spatially resolved measurements have been made at a resolution of 40 #x03BC;m. Four samples have been examined with this instrument: (1) a mica plate, (2) a Polaroid polarizer, and (3) two quartz plates.
AB - The two-modulator generalized ellipsometer has been used to measure samples in transmission. In this configuration, the instrument can completely characterize a linear diattenuator and retarder, measuring birefringence, diattenuation, the angle of the principal axis, and the sample depolarization simultaneously and accurately. This instrument can be operated in two modes: (1) spectroscopic, in which measurements are made through the entire sample aperture as a function of wavelength, and (2) spatially resolved, in which measurements are made at a single wavelength and a birefringence picture is made of the sample. Current spatially resolved measurements have been made at a resolution of 40 #x03BC;m. Four samples have been examined with this instrument: (1) a mica plate, (2) a Polaroid polarizer, and (3) two quartz plates.
UR - http://www.scopus.com/inward/record.url?scp=0036849665&partnerID=8YFLogxK
U2 - 10.1364/AO.41.006555
DO - 10.1364/AO.41.006555
M3 - Article
AN - SCOPUS:0036849665
SN - 1559-128X
VL - 41
SP - 6555
EP - 6566
JO - Applied Optics
JF - Applied Optics
IS - 31
ER -