Transmission electron microscopy study of (103)-oriented epitaxial SrBi2Nb2O9 films grown on (111) SrTiO3 and (111) SrRuO3/(111) SrTiO3

M. A. Zurbuchen; J. Lettieri; Y. Jia; D. G. Schlom; S. K. Streiffer; M. E. Hawley

doi:10.1557/JMR.2001.0072

Transmission electron microscopy study of (103)-oriented epitaxial SrBi₂Nb₂O₉ films grown on (111) SrTiO₃ and (111) SrRuO₃/(111) SrTiO₃

M. A. Zurbuchen, J. Lettieri, Y. Jia, D. G. Schlom, S. K. Streiffer, M. E. Hawley

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

Abstract

Portions of the same epitaxial (103)-oriented SrBi₂Nb₂O₉ film grown on (111) SrTiO₃ for which we recently reported the highest remanent polarization (P_r) ever achieved in SrBi₂Nb₂O₉ (or SrBi₂Ta₂O₉) films, i.e., P_r = 15.7 μC/cm², have been characterized microstructurally by plan-view and cross-sectional transmission electron microscopy (TEM) along three orthogonal viewing directions. SrBi₂Nb₂O₉ grows with its c axis tilted 57° from the substrate surface normal in a three-fold twin structure about the substrate [111], with the growth twins' c axes nominally aligned with the three 〈100〉 SrTiO₃ directions. (103) SrBi₂Nb₂O₉ films with and without an underlying epitaxial SrRuO₃ bottom electrode have been studied. Dark-field TEM imaging over a 12 μm² area shows no evidence of second phases (crystalline or amorphous). A high density of out-of-phase boundaries exists in the films.

Original language	English
Pages (from-to)	489-502
Number of pages	14
Journal	Journal of Materials Research
Volume	16
Issue number	2
DOIs	https://doi.org/10.1557/JMR.2001.0072
State	Published - Feb 2001
Externally published	Yes

Funding

We gratefully acknowledge the financial support of the United States Department of Energy through Grant No. DE-FG02-97ER45638 for the work performed at Penn State and Contract W-31-109-ENG-38 for the work performed at Argonne National Laboratory (ANL). In addition, we acknowledge the ANL Electron Microscopy Center and the Pennsylvania State University Materials Characterization Laboratory for use of their microscopy facilities, Augsburg University for use of their facilities while writing this article (supported by the Bundesmin-isterium für Bildung und Forschung (BMBF) project 13N6918/1), and Mark Kirk for enlightening discussions.

Access to Document

10.1557/JMR.2001.0072

Cite this

@article{2e14b832861f4fb6ac8d29ab5edbb0be,

title = "Transmission electron microscopy study of (103)-oriented epitaxial SrBi2Nb2O9 films grown on (111) SrTiO3 and (111) SrRuO3/(111) SrTiO3",

abstract = "Portions of the same epitaxial (103)-oriented SrBi2Nb2O9 film grown on (111) SrTiO3 for which we recently reported the highest remanent polarization (Pr) ever achieved in SrBi2Nb2O9 (or SrBi2Ta2O9) films, i.e., Pr = 15.7 μC/cm2, have been characterized microstructurally by plan-view and cross-sectional transmission electron microscopy (TEM) along three orthogonal viewing directions. SrBi2Nb2O9 grows with its c axis tilted 57° from the substrate surface normal in a three-fold twin structure about the substrate [111], with the growth twins' c axes nominally aligned with the three 〈100〉 SrTiO3 directions. (103) SrBi2Nb2O9 films with and without an underlying epitaxial SrRuO3 bottom electrode have been studied. Dark-field TEM imaging over a 12 μm2 area shows no evidence of second phases (crystalline or amorphous). A high density of out-of-phase boundaries exists in the films.",

author = "Zurbuchen, {M. A.} and J. Lettieri and Y. Jia and Schlom, {D. G.} and Streiffer, {S. K.} and Hawley, {M. E.}",

year = "2001",

month = feb,

doi = "10.1557/JMR.2001.0072",

language = "English",

volume = "16",

pages = "489--502",

journal = "Journal of Materials Research",

issn = "0884-2914",

publisher = "Springer",

number = "2",

}

TY - JOUR

T1 - Transmission electron microscopy study of (103)-oriented epitaxial SrBi2Nb2O9 films grown on (111) SrTiO3 and (111) SrRuO3/(111) SrTiO3

AU - Zurbuchen, M. A.

AU - Lettieri, J.

AU - Jia, Y.

AU - Schlom, D. G.

AU - Streiffer, S. K.

AU - Hawley, M. E.

PY - 2001/2

Y1 - 2001/2

N2 - Portions of the same epitaxial (103)-oriented SrBi2Nb2O9 film grown on (111) SrTiO3 for which we recently reported the highest remanent polarization (Pr) ever achieved in SrBi2Nb2O9 (or SrBi2Ta2O9) films, i.e., Pr = 15.7 μC/cm2, have been characterized microstructurally by plan-view and cross-sectional transmission electron microscopy (TEM) along three orthogonal viewing directions. SrBi2Nb2O9 grows with its c axis tilted 57° from the substrate surface normal in a three-fold twin structure about the substrate [111], with the growth twins' c axes nominally aligned with the three 〈100〉 SrTiO3 directions. (103) SrBi2Nb2O9 films with and without an underlying epitaxial SrRuO3 bottom electrode have been studied. Dark-field TEM imaging over a 12 μm2 area shows no evidence of second phases (crystalline or amorphous). A high density of out-of-phase boundaries exists in the films.

AB - Portions of the same epitaxial (103)-oriented SrBi2Nb2O9 film grown on (111) SrTiO3 for which we recently reported the highest remanent polarization (Pr) ever achieved in SrBi2Nb2O9 (or SrBi2Ta2O9) films, i.e., Pr = 15.7 μC/cm2, have been characterized microstructurally by plan-view and cross-sectional transmission electron microscopy (TEM) along three orthogonal viewing directions. SrBi2Nb2O9 grows with its c axis tilted 57° from the substrate surface normal in a three-fold twin structure about the substrate [111], with the growth twins' c axes nominally aligned with the three 〈100〉 SrTiO3 directions. (103) SrBi2Nb2O9 films with and without an underlying epitaxial SrRuO3 bottom electrode have been studied. Dark-field TEM imaging over a 12 μm2 area shows no evidence of second phases (crystalline or amorphous). A high density of out-of-phase boundaries exists in the films.

UR - http://www.scopus.com/inward/record.url?scp=0035262026&partnerID=8YFLogxK

U2 - 10.1557/JMR.2001.0072

DO - 10.1557/JMR.2001.0072

M3 - Article

AN - SCOPUS:0035262026

SN - 0884-2914

VL - 16

SP - 489

EP - 502

JO - Journal of Materials Research

JF - Journal of Materials Research

IS - 2

ER -

Transmission electron microscopy study of (103)-oriented epitaxial SrBi₂Nb₂O₉ films grown on (111) SrTiO₃ and (111) SrRuO₃/(111) SrTiO₃

Abstract

Funding

Access to Document

Other files and links

Fingerprint

Cite this