Transient Heat Transport in Subcooled He II Associated with JT Effect

R. Maekawa; A. Iwamoto; S. Hamaguchi

doi:10.1063/1.1774781

Transient Heat Transport in Subcooled He II Associated with JT Effect

R. Maekawa, A. Iwamoto, S. Hamaguchi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Transient heat transport in subcooled He II has been investigated in a 1 m long rectangular channel with distributed contractions: one-closed end has a heater, while the other end is open to the He II bath. Experiments were conducted applying heat pulses and recording the temperature profile with seven Allan Bradley resistors placed along the channel. Cernox sensor was indium soldered on the heater surface to monitor the onset of film boiling. As the onset of heat pulse, the pressure at the heater surface increased because of phase change from subcooled He II to He I. Further increasing of heat pulse leads to coexistence of triple-phase, He I vapor layer, He I and subcooled He II, at the vicinity of heater surface. These effects induced instantaneous He II temperature drop along the channel, which is caused by Joule-Thomson (JT) effect. A simple model gives an approximate mechanism of pressure increase in the channel. The paper describes transient heat transport mechanism in the channel and discusses JT effect within the channel.

Original language	English
Title of host publication	Advances in Cryogenic Engineering
Subtitle of host publication	Transactions of the Cryogenic Engineering Conference - CEC
Editors	John Pfotenhauer, Steven Van Sciver, Albert Zeller, Jonathan Demko, Christopher Rey, John G. Weisend II, John Barclay, Michael DiPirro, Quan-Sheng Shu, Peter Kittel, Edward Daly, John R. Hull, Jennifer Lock, Joseph Waynert, Susan Breon, James Maddocks, John Zbasnik, Patrick J. Kelley, Arkadiy Klebaner
Publisher	American Institute of Physics Inc.
Pages	991-998
Number of pages	8
ISBN (Electronic)	0735401861
DOIs	https://doi.org/10.1063/1.1774781
State	Published - Jun 23 2004
Externally published	Yes
Event	2003 Cryogenic Engineering Conference, CEC 2003 - Anchorage, United States Duration: Sep 22 2003 → Sep 26 2003

Publication series

Name	AIP Conference Proceedings
Volume	710
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Conference

Conference	2003 Cryogenic Engineering Conference, CEC 2003
Country/Territory	United States
City	Anchorage
Period	09/22/03 → 09/26/03

Access to Document

10.1063/1.1774781

Cite this

Maekawa, R., Iwamoto, A., & Hamaguchi, S. (2004). Transient Heat Transport in Subcooled He II Associated with JT Effect. In J. Pfotenhauer, S. Van Sciver, A. Zeller, J. Demko, C. Rey, J. G. Weisend II, J. Barclay, M. DiPirro, Q.-S. Shu, P. Kittel, E. Daly, J. R. Hull, J. Lock, J. Waynert, S. Breon, J. Maddocks, J. Zbasnik, P. J. Kelley, & A. Klebaner (Eds.), Advances in Cryogenic Engineering: Transactions of the Cryogenic Engineering Conference - CEC (pp. 991-998). (AIP Conference Proceedings; Vol. 710). American Institute of Physics Inc.. https://doi.org/10.1063/1.1774781

Maekawa, R. ; Iwamoto, A. ; Hamaguchi, S. / Transient Heat Transport in Subcooled He II Associated with JT Effect. Advances in Cryogenic Engineering: Transactions of the Cryogenic Engineering Conference - CEC. editor / John Pfotenhauer ; Steven Van Sciver ; Albert Zeller ; Jonathan Demko ; Christopher Rey ; John G. Weisend II ; John Barclay ; Michael DiPirro ; Quan-Sheng Shu ; Peter Kittel ; Edward Daly ; John R. Hull ; Jennifer Lock ; Joseph Waynert ; Susan Breon ; James Maddocks ; John Zbasnik ; Patrick J. Kelley ; Arkadiy Klebaner. American Institute of Physics Inc., 2004. pp. 991-998 (AIP Conference Proceedings).

@inproceedings{e20fa3972ff84147968b2e3aac8b381f,

title = "Transient Heat Transport in Subcooled He II Associated with JT Effect",

abstract = "Transient heat transport in subcooled He II has been investigated in a 1 m long rectangular channel with distributed contractions: one-closed end has a heater, while the other end is open to the He II bath. Experiments were conducted applying heat pulses and recording the temperature profile with seven Allan Bradley resistors placed along the channel. Cernox sensor was indium soldered on the heater surface to monitor the onset of film boiling. As the onset of heat pulse, the pressure at the heater surface increased because of phase change from subcooled He II to He I. Further increasing of heat pulse leads to coexistence of triple-phase, He I vapor layer, He I and subcooled He II, at the vicinity of heater surface. These effects induced instantaneous He II temperature drop along the channel, which is caused by Joule-Thomson (JT) effect. A simple model gives an approximate mechanism of pressure increase in the channel. The paper describes transient heat transport mechanism in the channel and discusses JT effect within the channel.",

author = "R. Maekawa and A. Iwamoto and S. Hamaguchi",

note = "Publisher Copyright: {\textcopyright} 2004 American Institute of Physics.; 2003 Cryogenic Engineering Conference, CEC 2003 ; Conference date: 22-09-2003 Through 26-09-2003",

year = "2004",

month = jun,

day = "23",

doi = "10.1063/1.1774781",

language = "English",

series = "AIP Conference Proceedings",

publisher = "American Institute of Physics Inc.",

pages = "991--998",

editor = "John Pfotenhauer and {Van Sciver}, Steven and Albert Zeller and Jonathan Demko and Christopher Rey and {Weisend II}, {John G.} and John Barclay and Michael DiPirro and Quan-Sheng Shu and Peter Kittel and Edward Daly and Hull, {John R.} and Jennifer Lock and Joseph Waynert and Susan Breon and James Maddocks and John Zbasnik and Kelley, {Patrick J.} and Arkadiy Klebaner",

booktitle = "Advances in Cryogenic Engineering",

}

Maekawa, R, Iwamoto, A & Hamaguchi, S 2004, Transient Heat Transport in Subcooled He II Associated with JT Effect. in J Pfotenhauer, S Van Sciver, A Zeller, J Demko, C Rey, JG Weisend II, J Barclay, M DiPirro, Q-S Shu, P Kittel, E Daly, JR Hull, J Lock, J Waynert, S Breon, J Maddocks, J Zbasnik, PJ Kelley & A Klebaner (eds), Advances in Cryogenic Engineering: Transactions of the Cryogenic Engineering Conference - CEC. AIP Conference Proceedings, vol. 710, American Institute of Physics Inc., pp. 991-998, 2003 Cryogenic Engineering Conference, CEC 2003, Anchorage, United States, 09/22/03. https://doi.org/10.1063/1.1774781

Transient Heat Transport in Subcooled He II Associated with JT Effect. / Maekawa, R.; Iwamoto, A.; Hamaguchi, S.
Advances in Cryogenic Engineering: Transactions of the Cryogenic Engineering Conference - CEC. ed. / John Pfotenhauer; Steven Van Sciver; Albert Zeller; Jonathan Demko; Christopher Rey; John G. Weisend II; John Barclay; Michael DiPirro; Quan-Sheng Shu; Peter Kittel; Edward Daly; John R. Hull; Jennifer Lock; Joseph Waynert; Susan Breon; James Maddocks; John Zbasnik; Patrick J. Kelley; Arkadiy Klebaner. American Institute of Physics Inc., 2004. p. 991-998 (AIP Conference Proceedings; Vol. 710).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Transient Heat Transport in Subcooled He II Associated with JT Effect

AU - Maekawa, R.

AU - Iwamoto, A.

AU - Hamaguchi, S.

PY - 2004/6/23

Y1 - 2004/6/23

N2 - Transient heat transport in subcooled He II has been investigated in a 1 m long rectangular channel with distributed contractions: one-closed end has a heater, while the other end is open to the He II bath. Experiments were conducted applying heat pulses and recording the temperature profile with seven Allan Bradley resistors placed along the channel. Cernox sensor was indium soldered on the heater surface to monitor the onset of film boiling. As the onset of heat pulse, the pressure at the heater surface increased because of phase change from subcooled He II to He I. Further increasing of heat pulse leads to coexistence of triple-phase, He I vapor layer, He I and subcooled He II, at the vicinity of heater surface. These effects induced instantaneous He II temperature drop along the channel, which is caused by Joule-Thomson (JT) effect. A simple model gives an approximate mechanism of pressure increase in the channel. The paper describes transient heat transport mechanism in the channel and discusses JT effect within the channel.

AB - Transient heat transport in subcooled He II has been investigated in a 1 m long rectangular channel with distributed contractions: one-closed end has a heater, while the other end is open to the He II bath. Experiments were conducted applying heat pulses and recording the temperature profile with seven Allan Bradley resistors placed along the channel. Cernox sensor was indium soldered on the heater surface to monitor the onset of film boiling. As the onset of heat pulse, the pressure at the heater surface increased because of phase change from subcooled He II to He I. Further increasing of heat pulse leads to coexistence of triple-phase, He I vapor layer, He I and subcooled He II, at the vicinity of heater surface. These effects induced instantaneous He II temperature drop along the channel, which is caused by Joule-Thomson (JT) effect. A simple model gives an approximate mechanism of pressure increase in the channel. The paper describes transient heat transport mechanism in the channel and discusses JT effect within the channel.

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A2 - Van Sciver, Steven

A2 - Zeller, Albert

A2 - Demko, Jonathan

A2 - Rey, Christopher

A2 - Weisend II, John G.

A2 - Barclay, John

A2 - DiPirro, Michael

A2 - Shu, Quan-Sheng

A2 - Kittel, Peter

A2 - Daly, Edward

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A2 - Waynert, Joseph

A2 - Breon, Susan

A2 - Maddocks, James

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PB - American Institute of Physics Inc.

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Maekawa R, Iwamoto A, Hamaguchi S. Transient Heat Transport in Subcooled He II Associated with JT Effect. In Pfotenhauer J, Van Sciver S, Zeller A, Demko J, Rey C, Weisend II JG, Barclay J, DiPirro M, Shu QS, Kittel P, Daly E, Hull JR, Lock J, Waynert J, Breon S, Maddocks J, Zbasnik J, Kelley PJ, Klebaner A, editors, Advances in Cryogenic Engineering: Transactions of the Cryogenic Engineering Conference - CEC. American Institute of Physics Inc. 2004. p. 991-998. (AIP Conference Proceedings). doi: 10.1063/1.1774781

Transient Heat Transport in Subcooled He II Associated with JT Effect

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