Towards fully integrated high temperature wireless sensors using GaN-based HEMT devices

Mohammed Aminul Huque, Syed Kamrul Islam, Phani Teja Kuruganti

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

Wireless sensors that are capable of working in extreme environments can significantly improve the efficiency and performance of industrial processes by facilitating better monitoring and control. Gallium Nitride (GaN), a widely researched wide bandgap material, can potentially be used to fabricate components for sensing and actuation for high temperature integrated wireless sensors. In this paper we are presenting an experimental study on the performance of AlGaN/GaN HEMT at high temperatures (up to 300°C). From test results, DC and microwave parameters at different temperatures were extracted.

Original languageEnglish
Title of host publication2008 IEEE International 51st Midwest Symposium on Circuits and Systems, MWSCAS
Pages582-585
Number of pages4
DOIs
StatePublished - 2008
Event2008 IEEE International 51st Midwest Symposium on Circuits and Systems, MWSCAS - Knoxville, TN, United States
Duration: Aug 10 2008Aug 13 2008

Publication series

NameMidwest Symposium on Circuits and Systems
ISSN (Print)1548-3746

Conference

Conference2008 IEEE International 51st Midwest Symposium on Circuits and Systems, MWSCAS
Country/TerritoryUnited States
CityKnoxville, TN
Period08/10/0808/13/08

Fingerprint

Dive into the research topics of 'Towards fully integrated high temperature wireless sensors using GaN-based HEMT devices'. Together they form a unique fingerprint.

Cite this