Topological insulators Bi 2Te 3 and Bi 2Se 3 grown by MBE on (001) GaAs substrates

  • X. Liu
  • , D. J. Smith
  • , J. Fan
  • , Y. H. Zhang
  • , H. Cao
  • , Y. P. Chen
  • , B. J. Kirby
  • , N. Sun
  • , S. T. Ruggiero
  • , J. Leiner
  • , R. E. Pimpinella
  • , J. Hagmann
  • , K. Tivakornsasithorn
  • , M. Dobrowolska
  • , J. K. Furdyna

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

7 Scopus citations

Abstract

Bi 2Te 3 Bi 2Se 3 and their alloy films were successfully grown by molecular beam epitaxy (MBE) on (001) GaAs substrates. The structural properties of these films were investigated by Reflection high-energy electron diffraction (RHEED), Atomic force microscopy (AFM), X-ray diffraction (XRD), High-resolution transmission electron microscopy (HRTEM) and Raman spectroscopy and mapping. The results indicate that the epitaxial films are highly uniform. High-field and low-temperature magneto-transport measurements on these films are carried out and discussed.

Original languageEnglish
Title of host publication15th International Conference on Narrow Gap Systems, NGS15
Pages105-108
Number of pages4
DOIs
StatePublished - 2011
Externally publishedYes
Event15th International Conference on Narrow Gap Systems, NGS15 - Blacksburg, VA, United States
Duration: Aug 1 2011Aug 5 2011

Publication series

NameAIP Conference Proceedings
Volume1416
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference15th International Conference on Narrow Gap Systems, NGS15
Country/TerritoryUnited States
CityBlacksburg, VA
Period08/1/1108/5/11

Keywords

  • MBE
  • Magnetotransport
  • Raman
  • TEM
  • Topological Insulators
  • XRD

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