ToF-SIMS Li Depth Profiling of Pure and Methylated Amorphous Silicon Electrodes after Their Partial Lithiation

Yue Feng, Bon Min Koo, Antoine Seyeux, Jolanta Światowska, Catherine Henry De Villeneuve, Michel Rosso, François Ozanam

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Fingerprint

Dive into the research topics of 'ToF-SIMS Li Depth Profiling of Pure and Methylated Amorphous Silicon Electrodes after Their Partial Lithiation'. Together they form a unique fingerprint.

Chemistry

Engineering

Material Science